Oxidization and passivation method and passivation device of silicon
A technology of ozone oxidation and gas guiding device, which is applied in the direction of sustainable manufacturing/processing, electrical components, climate sustainability, etc., can solve problems such as device performance impact, and achieve the effects of improving quality, being easy to implement, and reducing temperature
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Embodiment 1
[0040] This embodiment provides a silicon oxidation passivation method, including:
[0041] 1) Insert the polycrystalline silicon wafer with silicon nanowires obtained by metal silver catalytic etching into the quartz rack, and then put the quartz rack into the sampling area and wait to enter the heating furnace;
[0042] 2) Pour nitrogen into the heating furnace with a nitrogen flow rate of 1000 sccm. After nitrogen is blown for 5 minutes, the quartz holder carrying the sample enters the heating furnace from the sampling area;
[0043] 3) Stop feeding nitrogen into the heating furnace, and start feeding ozone into the heating furnace. The flow of ozone gas is 4000sccm;
[0044] 4) Start the heating furnace at a heating rate of 20°C / min, increase the temperature to 550°C for 30 minutes, and then reduce the temperature to 200°C at a cooling rate of 20°C / min;
[0045] 5) Stop passing ozone and pass nitrogen into the heating furnace with a nitrogen flow rate of 2000sccm;
[0046] 6) After 5...
Embodiment 2
[0053] This embodiment provides a silicon oxidation passivation method, including:
[0054] 1) Insert the single crystal silicon wafer with porous silicon on the surface obtained by catalytic etching of metallic silver into the quartz holder, and then put the quartz holder into the sampling area and wait to enter the heating furnace;
[0055] 2) Pour nitrogen into the heating furnace with a nitrogen flow rate of 2000 sccm. After nitrogen is blown for 4 minutes, the quartz holder carrying the sample enters the heating furnace from the sampling area;
[0056] 3) Stop feeding nitrogen into the heating furnace and start feeding ozone into the heating furnace, the flow of ozone gas flow is 3000sccm;
[0057] 4) Start the heating furnace at a heating rate of 20°C / min, increase the temperature to 800°C for 20 minutes, and then decrease the temperature to 200°C at a cooling rate of 20°C / min;
[0058] 5) Stop passing ozone and pass nitrogen into the heating furnace with a nitrogen flow rate of 3...
Embodiment 3
[0063] This embodiment provides a silicon oxidation passivation method, including:
[0064] 1) Insert the polycrystalline silicon wafer with porous silicon on the surface obtained by electrochemical anodization and etching into the quartz holder, and then put the quartz holder into the sampling area and wait for it to enter the heating furnace;
[0065] 2) Blow nitrogen into the heating furnace with a nitrogen flow rate of 3000 sccm. After nitrogen is blown for 2 minutes, the quartz holder carrying the sample enters the heating furnace from the sampling area;
[0066] 3) Stop passing nitrogen gas into the heating furnace, and start passing ozone into the heating furnace. The ozone gas flow rate is 2000 sccm.
[0067] 4) Start the heating furnace at a heating rate of 15°C / min, increase the temperature to 300°C for 60 minutes, and then decrease the temperature to 150°C at a rate of 15°C / min;
[0068] 5) Stop passing ozone, and pass nitrogen into the heating furnace, the flow of nitrogen i...
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