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Processed high-purity copper material having uniform and fine crystalline structure, and process for production thereof

A technology of crystal structure and manufacturing method, applied in the field of high-purity copper processing materials, can solve problems such as difficulty in obtaining fine grains stably, and achieve the effect of reducing the occurrence of defects and uniform sputtering

Active Publication Date: 2012-10-31
MITSUBISHI MATERIALS CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, there is a problem that it is difficult to stably obtain fine grains with an average grain size of 200 μm or less industrially

Method used

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  • Processed high-purity copper material having uniform and fine crystalline structure, and process for production thereof
  • Processed high-purity copper material having uniform and fine crystalline structure, and process for production thereof
  • Processed high-purity copper material having uniform and fine crystalline structure, and process for production thereof

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Embodiment

[0060] Next, the present embodiment will be specifically described by way of examples.

[0061] Manufactures high-purity copper ingots with a Cu purity of 99.9999% by mass or higher and a size of 250 mm in diameter and 600 mm in length. The high-purity copper ingots are manufactured by unidirectional solidification, in which the surface of the molten metal solidifies last in the manufacturing process. Therefore, there are no casting defects such as shrinkage cavities or voids inside the ingot, and the ingot has a sound casting structure.

[0062] As a result of measuring the size of the crystal grains of the ingot, it was found that the size of the crystal grains was 1,000 to 200,000 μm, the variation in the size of the crystal grains was large, and all the crystal grains were coarse.

[0063] Table 2 shows the measured average crystal grain size of the ingot and the deviation of the crystal grain size (=area ratio of crystal grains having a grain size larger than 2.5 times t...

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Abstract

Disclosed is a processed high-purity copper material which comprises Cu having a purity of 99.9999 mass% or more and has an average crystal particle diameter of 20 [mu]m or less, wherein the ratio of an area occupied by crystal particles having particle diameters more than 2.5 times higher than the average crystal particle diameter is less than 10% of the total area occupied by all of the crystal particles in the particle size distribution of the crystal particles. Also disclosed is a process for producing the processed high-purity copper material, which comprises carrying out the hot forging of a mass of a cast comprising high-purity copper having a Cu purity of 99.9999 mass% or more at an initial temperature of 550 DEG C or higher, cooling the hot-forged product with water, carrying out the warm forging of the cooled product at an initial temperature of 350 DEG C or higher, cooling the warm-forged product with water, carrying out the cold cross-rolling of the cooled product at a total reduction of 50% or more, and carrying out the stress relief annealing of the rolled product at 200 DEG C or higher.

Description

technical field [0001] The present invention relates to a high-purity copper processed material having a uniform and fine crystal structure suitable for use as a sputtering target, for example, and a method for producing the same. [0002] This application claims priority based on Japanese Patent Application No. 2010-48516 for which it applied in Japan on March 5, 2010, and uses the content here. Background technique [0003] As a method of forming a conductive film or the like when manufacturing semiconductor devices such as ICs, LSIs, and ULSIs, sputtering using a high-purity copper target with fine crystal grains, electrolysis in a plating bath using a high-purity copper anode, etc. are known. . The high-purity copper preferably has a purity of 99.9999% by mass or more and fine crystal grains with an average crystal grain size of 200 μm or less. [0004] For example, as shown in Patent Documents 1 and 2, high-purity copper having fine crystal grains is produced as follo...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): C22F1/08B21B3/00B22D21/00C23C14/34C22F1/00
CPCC23C14/165B21B2003/005C23C14/3414C22F1/08B21B3/00B22D21/00C23C14/34
Inventor 熊谷训小出正登
Owner MITSUBISHI MATERIALS CORP
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