Method for depositing silicon nitride film, crystalline silicon solar energy battery and manufacturing method of crystalline silicon solar energy battery
A solar cell and silicon nitride film technology, which is applied in the field of solar cells, can solve the problems affecting the conversion efficiency of solar cells and the quality degradation of silicon nitride films, etc., to reduce the light absorption coefficient, improve the anti-reflection effect, and increase the production rate. Effect
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Embodiment 1
[0036] Silicon nitride film was deposited on the silicon wafer that has been textured, diffused and etched by flat PECVD equipment. The belt speed was set at 180cm / min and the chamber temperature was 340°C. The chamber of the flat PECVD equipment used had 8 gas paths, controlling SiH of the first 3 gas paths 4 and NH 3 The volume ratio is 1:1.2, SiH 4 The flow rate is 180sccm; in the last 5 gas paths, the SiH in the reaction gas 4 and NH 3 The volume ratio of SiH is 1:3, and SiH 4 The flow rate is 90 sccm; then the silicon wafer deposited by the silicon nitride film is subjected to screen printing electrodes and sintering processes to form the solar cell of Example 1.
Embodiment 2
[0038] Silicon nitride film was deposited on the silicon wafer that has been textured, diffused and etched by flat PECVD equipment. The belt speed was set at 190cm / min and the chamber temperature was 340°C. The chamber of the flat PECVD equipment used had 8 gas paths, controlling SiH of the first 3 gas paths 4 and NH 3 The volume ratio is 1:1.5, SiH 4 The flow rate is 200sccm; in the last 5 gas paths, SiH in the reaction gas 4 and NH 3 The volume ratio of SiH is 1:3.5, and SiH 4 The flow rate is 110 sccm; then the silicon wafer deposited by the silicon nitride film will go through the screen printing electrode and sintering process to form the solar cell of Example 2.
Embodiment 3
[0040] The silicon wafers that have undergone texturing, diffusion, and etching are deposited with a flat-plate PECVD equipment to deposit a silicon nitride film. The belt speed is set at 200cm / min, and the chamber temperature is 340°C. The chamber of the flat-plate PECVD equipment used has 8 gas paths, controlling SiH of the first 3 gas paths 4 and NH 3 The volume ratio is 1:1.8, SiH 4 The flow rate is 230sccm; in the last 5 gas paths, SiH in the reaction gas 4 and NH 3 The volume ratio of SiH is 1:3.8, and SiH 4 The flow rate is 100 sccm; then the silicon wafer deposited by the silicon nitride film goes through the screen printing electrode and sintering process to form the solar cell of Example 3.
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