Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

GaN-based semiconductor light-emitting diode and manufacture method thereof

A technology for light-emitting diodes and semiconductors, which is applied in the manufacture of semiconductor/solid-state devices, semiconductor devices, electrical components, etc., and can solve problems such as crystal strain, degradation of the quality and performance of epitaxial layers on the substrate, and shortened life of light-emitting diodes.

Inactive Publication Date: 2013-01-02
JIANGSU WINAD LIGHTING TECH
View PDF3 Cites 9 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The above-mentioned semiconductor materials used as substrates generally contain various defects, such as dislocations, gaps or vacancies, etc. The defects will cause crystal strain, and the strain will reduce the quality and performance of the epitaxial layer on the substrate, resulting in a shortened life of the light-emitting diode.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • GaN-based semiconductor light-emitting diode and manufacture method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0017] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments, but not as a limitation of the present invention.

[0018] The GaN-based semiconductor light emitting diode of the present invention comprises a substrate 1 , a p-type contact layer 2 , an active layer 3 and an n-type contact layer 4 stacked in sequence.

[0019] Wherein, the substrate 1 is GaN, the p-type contact layer 2 is a p-type AlGaN layer, and the n-type contact layer 4 is an n-type GaN layer.

[0020] The active layer 3 is an AlGaN multiple quantum well, and the preferred AlGaN active layer is 2-5 periods of Al x Ga 1-x N / Al y Ga 1-y N multi-quantum wells, wherein, the thickness of the well is 1-3nm, the Al composition x=0-0.5; the thickness of the barrier is 5-10nm, the Al composition y=0.2-0.7, which is a quantum quantum well that emits deep ultraviolet light trap.

[0021] An n-type electron blocking layer 5 and an n-type transi...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
Thicknessaaaaaaaaaa
Login to View More

Abstract

The invention provides a manufacture method of a GaN-based semiconductor light-emitting diode. The manufacture method includes the steps of forming of a GaN substrate and deposition of a p-type contact layer, an active layer, an n-type electronic barrier layer, an n-type transition layer and an n-type contact layer on the GaN substrate, wherein forming of the GaN substrate includes the steps: placing a GaN wafer into a high-temperature and high-pressure device at the normal temperature and under the normal pressure; heating and pressurizing the GaN wafer simultaneously for 10-15 minutes, wherein the heating temperature is 820-880 DEG C, and the pressurizing pressure is 4.1-4.6GPa; stopping heating to enable the GaN wafer to be cooled to the normal temperature; slowly releasing pressure to enable the GaN wafer to be recovered to the normal pressure; and taking the GaN wafer out after annealing in the high-temperature and high-pressure device for 20-30minutes. By the manufacture method, crystal defect density in a light-emitting diode substrate can be obviously reduced, the performance of the light-emitting diode is improved, and the service life of the light-emitting diode is prolonged.

Description

technical field [0001] The invention relates to a method for manufacturing a light emitting diode. Background technique [0002] Semiconductor light-emitting diode (LED) is a diode made of compounds such as Ga, N, As, P, etc. It can emit visible light when electrons and holes recombine, and can be used to manufacture light-emitting devices. Due to its simple structure and small size, The working current is small, easy to use, and low cost, and has been widely used in various photoelectric systems. [0003] The semiconductor light emitting diode includes a substrate and a P / N epitaxial layer, an active layer and a P / N epitaxial layer deposited on the substrate in sequence. As the foundation of the LED building, the substrate plays an important role. Sapphire is a commonly used LED substrate, but due to the lattice and thermal stress mismatch between it and the heterogeneous epitaxial layer on it, it will crack due to different expansion degrees after heating, resulting in d...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H01L33/00H01L21/322
Inventor 虞浩辉周宇杭
Owner JIANGSU WINAD LIGHTING TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products