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Micro-displacement measurement method and sensing device for dual-workpiece platforms of photoetching machine

A technology of micro-displacement sensor and double workpiece table, which is applied in measuring device, electric device, exposure device of photoplate making process, etc., to achieve the effect of precise positioning, fast response speed and excellent linearity

Inactive Publication Date: 2013-01-16
HARBIN INST OF TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The present invention aims at the deficiencies in the above-mentioned prior art, and proposes a high-speed and high-precision micro-displacement measurement method and a sensing device for the double workpiece table of the lithography machine, so as to solve the problem of the Chuck table, the macro and micro double workpiece table of the lithography machine The monitoring problem of special positions such as the mask table achieves the purpose of simple structure, high integration, easy installation, high flexibility and fast response

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  • Micro-displacement measurement method and sensing device for dual-workpiece platforms of photoetching machine
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  • Micro-displacement measurement method and sensing device for dual-workpiece platforms of photoetching machine

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Embodiment Construction

[0021] Below in conjunction with accompanying drawing, specific embodiment of the present invention is described in further detail:

[0022] see figure 2 with image 3 , a micro-displacement measurement sensing device for double worktables of lithography machine, including double worktable 1 of lithography machine, double worktable macro motion mechanism 2, double work table micro motion mechanism 3 Hall connection Frame 4, Hall micro-displacement sensor 5 and external detection circuit 6; Described Hall micro-displacement sensor 5 is made up of mover permanent magnet group base 7, permanent magnet group 8 and stator gallium arsenide Hall element 9, wherein The mover permanent magnet group base 7 is fixed on the double-workpiece macro-motion mechanism 2 or the double-workpiece micro-motion mechanism 3, and the permanent magnet group 8 is fixed on the mover permanent magnet group base 7 in parallel and horizontally. Stator gallium arsenide Hall element 9 is installed on one ...

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Abstract

The invention discloses a micro-displacement measurement method and a sensing device for dual-workpiece platforms of a photoetching machine and belongs to technologies of integrated circuit (IC) manufacturing, ultra precise measurement and ultra precise processing. The measurement method comprises that output Hall voltage signals of a Hall micro-displacement sensor are changed linearly along with the relative displacement of macro and micro dual-workpiece platforms, and an external detection circuit processes and synthesizes output signals of the Hall sensor to finish measurement. The device solves the problems of high-speed high-precision relative position detection of special positions such as a Chuck platform and a mask platform of a photoetching macro and micro dual driving mechanism, the device has the advantages of being free from contacts, good in linearity, high in integration level and high in portable capability, one-dimensional measurement, two-dimensional measurement or three-dimensional measurement can be achieved, and the environmental requirements of a photoetching system can be met.

Description

technical field [0001] The invention belongs to IC manufacturing and ultra-precise measurement and processing technology, and mainly relates to a micro-displacement measurement method and a sensing device for a double workpiece table of a lithography machine. Background technique [0002] Lithography is the core step in the manufacture of large-scale integrated circuits. The macro-micro dual-workpiece technology is one of the main means to improve the performance of the lithography machine. The macro-micro dual-drive technology is a large-stroke, high-precision, high-speed positioning mechanism. The external research has achieved some results. [0003] Among them, photoelectric methods such as grating scales and laser interferometers have been used in double-workpiece stages through closed-loop feedback control: in August 2001, an article entitled "Large Stroke Control and Research of High-precision Pole Positioning Workbench", the workbench uses a single-frequency laser in...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G03F7/20G01B7/02
Inventor 王雷赵勃陈彦均
Owner HARBIN INST OF TECH
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