Unlock instant, AI-driven research and patent intelligence for your innovation.

Trench MOS transistor manufacturing method

A technology of MOS transistor and manufacturing method, applied in the field of semiconductor manufacturing process

Active Publication Date: 2017-06-23
SHANGHAI HUAHONG GRACE SEMICON MFG CORP
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, since the three processes of well implantation, source implantation, and contact hole formation are completed in three steps, three photomasks are required to complete these three processes.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Trench MOS transistor manufacturing method
  • Trench MOS transistor manufacturing method
  • Trench MOS transistor manufacturing method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0020] In order to make the content of the present invention clearer and easier to understand, the content of the present invention will be described in detail below with reference to specific embodiments and accompanying drawings.

[0021] figure 2 A flow chart of a method for fabricating a trench MOS transistor according to an embodiment of the present invention is schematically shown.

[0022] like figure 2 As shown, the method for fabricating a trench MOS transistor according to an embodiment of the present invention includes:

[0023] The trench forming step S1 is used to form trenches in the silicon wafer;

[0024] Step S2 of forming the gate structure, for forming the gate structure in the trench;

[0025] The interlayer dielectric deposition and etching step S3 is used for depositing the interlayer dielectric layer L1, and forming two patterns of contact holes in the interlayer dielectric layer by etching, one is the contact corresponding to the contact with the a...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A method for manufacturing a trench type MOS transistor comprises: forming a trench in a silicon wafer; forming a gate structure in the trench; depositing an interlayer dielectric layer, and forming two kinds of contact holes in the interlayer dielectric layer by etching Patterns, one is the pattern corresponding to the contact hole in contact with the active region, and the other is the pattern as the peripheral protection ring of the device; ion implantation of B and P in the two contact holes forms a well region and a source region, while forming a guard ring in the guard ring area; deposit tetraethyl orthosilicate in two patterns of contact holes; deposit borophosphosilicate glass in two patterns of contact holes; reflow borophosphosilicate glass, and Contact hole sealing in the guard ring area; etching of borophosphosilicate glass to form spacers for contact holes in contact with the active area, thereby reducing the initial critical dimension of the contact hole in contact with the active area to the final critical dimension; The silicon substrate is etched with orthosilicate and borophosphosilicate glass as a barrier layer to form a contact hole in contact with the active area; a contact hole barrier layer is formed and metal is deposited, and then the metal is etched.

Description

technical field [0001] The present invention relates to a semiconductor manufacturing process, and more particularly, the present invention relates to a method for manufacturing a trench MOS transistor. Background technique [0002] As a new type of vertical structure device, trench MOS (trench MOS) transistor is developed on the basis of VDMOS (vertical double-diffused metal-oxide semiconductor field effect transistor), both of which are high cell density devices. However, this structure has many performance advantages compared with the former: such as lower on-resistance, low gate-drain charge density, thus low conduction and switching losses and fast switching speed. At the same time, since the channel of the trench MOS is vertical, the channel density can be further increased and the chip size can be reduced. [0003] figure 1 is a cross-sectional view of a conventional trench MOS transistor. like figure 1 As shown, a conventional trench MOS transistor includes a sem...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/336H01L21/28
Inventor 吴亚贞楼颖颖刘宪周肖培冯凯
Owner SHANGHAI HUAHONG GRACE SEMICON MFG CORP