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Nano polishing solution for chemical/mechanical polishing

A chemical mechanical and polishing liquid technology, applied in the direction of polishing composition containing abrasives, etc., to achieve high removal rate and less residue

Active Publication Date: 2014-12-10
TIANJIN UNIVERSITY OF TECHNOLOGY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] All of the above are etching techniques for hafnium-based materials, but research on chemical mechanical polishing (CMP) of hafnium oxide or hafnium-based materials is rarely reported

Method used

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  • Nano polishing solution for chemical/mechanical polishing
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  • Nano polishing solution for chemical/mechanical polishing

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Embodiment 1-6

[0026] The formula of chemical mechanical polishing liquid embodiment 1-6 of the present invention is as shown in table 1, by the component and content that provides in table 1, mixes evenly in deionized water, for some water-insoluble borides, just need Stir it with other prepared ingredients evenly, so that the polishing liquid can contact the film evenly during polishing. While adding inorganic acid (the volume ratio of hydrochloric acid to phosphoric acid or sulfuric acid is 1:1), it can be used to adjust the pH value, and the final addition amount is based on the amount added when the pH value is stable, and the pH value range is 3- 7. The polishing solution can be prepared. Among the above fluoroborates, when potassium fluoroborate is selected as the etchant, due to its low solubility in water, it will partially decompose to form boron trifluoride under acidic conditions, which is beneficial to the removal of hafnium-based materials, so it should be the last It is added...

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Abstract

The invention relates to a nano polishing solution for chemical / mechanical polishing. The nano polishing solution comprises fluoborate, a nano abradant, a surfactant, inorganic acid, and solvent deionized water. The nano polishing solution has the advantages of good stability and less damage, is easy to clean, and does not corrode equipment. The polishing solution is suitable for the chemical / mechanical polishing of a hafnium-based material in the semiconductor field. The polishing solution is used for polishing hafnium oxide, the polishing speed can be controlled at 100-200nm / min, and the polished surface roughness can be lowered to less than 1nm.

Description

technical field [0001] The invention relates to microelectronic auxiliary materials and processing technology, in particular to a nano-polishing liquid for chemical mechanical polishing. technical background [0002] The increase of circuit density has become a major demand of today's microelectronics industry, which means that more electronic components need to be placed on the same size chip, and the reduction of device size is the general trend. The reduction of the characteristic size of MOS transistors requires the reduction of the thickness of the gate dielectric layer, and SiO2, which is a traditional gate dielectric layer material 2, When its size is reduced to 1.4nm and below, the impact of excessive leakage current and unstable interface characteristics on device performance can no longer be ignored. Therefore, a new type of high-k material is selected to replace the traditional SiO 2 A series of problems such as increasing the corresponding physical thickness of ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): C09G1/02
Inventor 张楷亮冯玉林王芳任君孙阔
Owner TIANJIN UNIVERSITY OF TECHNOLOGY