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Method and system of ultrahigh resolution phase difference measurement

An ultra-high resolution, phase difference technology, applied to measuring devices, measuring electrical variables, phase angles between voltage and current, etc., can solve the problem of being susceptible to noise interference, not suitable for long-term continuous measurement, and long-term measurement Drift and other issues

Inactive Publication Date: 2013-07-10
XIDIAN UNIV
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Problems solved by technology

The analog interpolation method uses the capacitance charging and discharging method to improve the measurement resolution, but the measurement resolution is limited by the filling clock frequency, and at the same time, it is susceptible to noise interference when the measured signal frequency is high
The time-to-digital conversion method and the vernier method use the delay line method to improve the measurement resolution, but the measurement resolution is limited by the resolution of the delay line, generally on the order of hundreds of picoseconds
The double-mixing time-of-flight method uses an intermediate crystal oscillator to measure the phase difference, and the resolution can reach the level of picoseconds. However, due to the influence of the intermediate crystal oscillator, this method has a large long-term measurement drift and is not suitable for long-term continuous measurement.

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  • Method and system of ultrahigh resolution phase difference measurement

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[0047] In order to make the objectives, technical solutions and advantages of the present invention clearer, the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention, but not to limit the invention.

[0048] figure 1 The structure of the ultra-high-resolution phase difference measurement system based on double combination detection with phase difference correction provided by the embodiment of the present invention is shown. For convenience of explanation, only the parts related to the present invention are shown.

[0049] The system includes:

[0050] Measured frequency signal input module 1;

[0051] Reference frequency signal input module 3;

[0052] Connected with the measured frequency signal input module 1, and used for shaping the measured frequency signal, a first signal shaping mod...

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Abstract

The invention discloses a method and a system of ultrahigh resolution phase difference measurement with phase difference correction function and based on double-coincidence detection. The method includes the steps that: a. a measurement gate is formed by means of double phase coincidence detection between two pilot frequency signals, a first phase coincidence detection and coincidence pulse generating circuit conducts phase coincidence detection to a detected frequency signal and a public frequency signal and generates coincidence pulse; b. a second phase coincidence detection and coincidence pulse generating circuit conducts phase coincidence detection to a reference frequency signal and the public frequency signal and generates coincidence pulse; c. a gate-time generating circuit generates a gate-time signal according to a received enabling signal and a received closing signal, and a single chip computer obtains phase difference of the detected frequency signal and the reference frequency signal according to count data; and d. the coincidence pulse is counted within the time range near the enabling time and closing time of the measurement gate and a corrected value of the phase difference is obtained. Lastly, the ultrahigh resolution phase difference measurement is accomplished. By means of the method and the system of ultrahigh resolution phase difference measurement, counting error is eliminated, measuring resolution ration is high, and long time drift distance is small.

Description

technical field [0001] The invention belongs to the technical field of time-frequency signal processing, and in particular relates to a method and system for ultra-high resolution phase difference measurement based on dual composite detection with phase difference correction. Background technique [0002] High-resolution phase difference measurement technology is widely used in scientific research and engineering practice, and plays an important role in the field of time-frequency measurement and control. In electronic measurement, high-resolution phase difference measurement modules are included in high-precision test instruments such as oscilloscopes, logic analyzers, and signal generators. Satellite-ground time synchronization, navigation and positioning, laser ranging, communication technology and other fields in engineering applications also require high-resolution phase difference measurement technology. High-resolution phase difference measurement technology is the c...

Claims

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Application Information

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IPC IPC(8): G01R25/08
Inventor 董绍锋周渭詹劲松胡为杜保强秦红波屈八一史琳李辰
Owner XIDIAN UNIV
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