Concentric circle mask, graphical substrate and manufacture method
A patterned substrate and manufacturing method technology, applied in the direction of photolithographic process exposure device, photographic process of pattern surface, instrument, etc., can solve the problem of inaccurate control of photolithographic pattern overlay, crown shape difference, inter-chip Repeatability and other issues, to avoid inaccurate control, simple operation, and simplified process
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0032] In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings.
[0033] In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. However, the present invention can be implemented in many other ways different from those described here, and those skilled in the art can make similar extensions without violating the connotation of the present invention, so the present invention is not limited by the specific implementations disclosed below.
[0034] The invention provides a concentric circular mask, such as figure 1 As shown, the concentric circle mask includes a photoresist plate, and the photoresist plate has an array of concentric circles, and each concentric circle 1 has an inner circle 2, a middle ring 3 and an oute...
PUM
Property | Measurement | Unit |
---|---|---|
Diameter | aaaaa | aaaaa |
Diameter | aaaaa | aaaaa |
Diameter | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com