A Rapid Semiquantitative Method for Trace Elements in gh4169 Alloy
A GH4169, trace element technology, used in material excitation analysis, fluorescence/phosphorescence, etc., can solve the problems of unstable graphite furnace performance, difficult to meet production needs, and high test costs, to facilitate repeated tests and improve material inspection efficiency. , to ensure the effect of accuracy
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Examples
Embodiment Construction
[0022] A fast semi-quantitative method for trace elements of GH4169 alloy, using XRF-1800 fluorescence spectrometer, using fluorescence spectroscopy to semi-quantify trace elements of GH4169 alloy, the content of the three elements in the sample is less than or equal to 0.005% respectively is a qualified sample ;
[0023] First, turn on the XRF-1800 fluorescence spectrometer, initialize the instrument, set the X fluorescence spectrometer, and adjust the instrument to adapt to the analysis of trace elements. The setting parameters are as follows: excitation voltage: 60KV, excitation current: 60mA, measurement Slit: standard, analysis crystal: LiF, detector: SC, measurement time: 20s, measurement method: P-2BG; measurement angle: 28.20 for Pb, 14.04 for Sn, 33.94 for As; pulse range: 12-72 for Pb , Sn is 28-68, As is 36-76; background correction position: Pb is 27.94, 28.54; Sn is 13.60, 14.40; As is 33.64, 34.24;
[0024] Measure the GH4169 standard substance, find out the 1% ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com