Fluorescent dark field microscopy device and method based on waveguide constraint

Abstract

The invention discloses a fluorescent dark field microscopy device and method based on waveguide constraint. The fluorescent dark field microscopy device comprises an illumination laser light source, a beam expansion lens, a near-end reflector, a carrier chip, a microobjective, a far-end reflector, a light filter, a collection lens and a CCD (Charge Coupled Device) image sensor; the method comprises the following steps that: the carrier chip which directly realizes the dark field function is prepared; lasers emitted by the illumination laser light source irradiate on a polymer film in the carrier chip through the near-end reflector after being subjected to beam expansion; fluorescence light emitted from fluorescent molecules in the light source forms a guiding mode in the carrier chip and is constrained at an interface of the polymer film and air, and thus, the bottom of a sample nearby the carrier chip is lightened by a near field and scattered; then, light is collected by the microobjective, after the illumination lasers are filtered by the far-end reflector and the light filter, the light is collected by the collection lens and forms an image at the CCD image sensor. The device and the method are based on the constraint of a fluorescent waveguide mode, the microscopy structure is simplified, and the dark field microscopy function is realized.

Description

technical field [0001] The invention relates to the technical field of microscopic imaging, in particular to a fluorescent dark field microscopic device and method based on waveguide confinement. Background technique [0002] As an essential tool in the field of microscopic imaging, optical microscope has been widely used by people in related fields. It is also divided into bright field microscopes, dark field microscopes, phase contrast microscopes, video microscopes, fluorescence microscopes, polarizing microscopes, confocal microscopes, metallographic microscopes, etc. due to different uses. In particular, in the case of some samples whose refractive index is relatively close to the surrounding environment, the observation results under bright field are not obvious, so dark field microscopy is often used for observation. The principle is generally to use some optical components to obliquely incident the illumination source on the sample at a larger angle (greater than th...

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Problems solved by technology

[0004] The technology of the present invention solves the problem: Overcoming the shortcomings of the existing dark-field microscope imaging technology, a fluorescent dark-field microscopy device and method based on waveguide confinement are proposed, whi

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