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Imaging spectrometer based on concentric off-axis double reflection systems

An imaging spectrometer, concentric off-axis technology, applied in the field of imaging spectroscopy, can solve the problems of low spectral resolution and imaging rate resolution, unable to correct coma and astigmatism at the same time, and achieve high spectral resolution and imaging resolution, Guarantee the effect of optical processing difficulty and processing cost, and simple structure

Active Publication Date: 2013-11-27
BEIJING INSTITUTE OF TECHNOLOGYGY
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Problems solved by technology

[0004] In order to solve the problem that the existing planar grating imaging spectrometer cannot simultaneously correct coma aberration and astigmatism, resulting in low spectral resolution and imaging rate resolution, the invention proposes an imaging spectrometer structure based on a concentric off-axis double reflection system

Method used

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  • Imaging spectrometer based on concentric off-axis double reflection systems
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  • Imaging spectrometer based on concentric off-axis double reflection systems

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Embodiment Construction

[0020] In the following, preferred embodiments according to the present invention will be described in detail with reference to the accompanying drawings.

[0021] image 3 Shown is an optical path diagram of an imaging spectrometer according to an embodiment of the present invention. The optical system of the imaging spectrometer includes: incident slit 1, primary mirror 2 in the collimating optical system (corresponding to the secondary mirror of the concentric off-axis double reflection system), secondary mirror 3 in the collimating optical system (corresponding to the reflection system primary mirror), planar grating 4, primary mirror 5 in the focusing optical system (corresponding to the primary mirror of the concentric off-axis double reflection system), secondary mirror 6 in the focusing optical system (corresponding to the secondary mirror of the concentric off-axis double reflection system mirror), array detector 7.

[0022] The object to be observed is placed at sl...

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Abstract

An imaging spectrometer based on concentric off-axis double reflection systems comprises an entrance slit, a collimation optical system, a plane grating, a focusing optical system and an array detector. The collimation optical system and the focusing optical system of the imaging spectrometer are respectively a concentric off-axis double reflection system and share the same optical parameters. Emergent light passing through the entrance slit is projected into the collimation optical system and is projected to the plane grating after light beam collimation is carried out through the collimation optical system, light beams diffracted from the plane grating are projected into the focusing optical system again, and the light beams are focused through the focusing optical system to form an image on the array detector. The imaging spectrometer resolves the problem that coma and astigmatism of a traditional plane grating imaging spectrometer are difficult to correct at the same time, and can achieve higher spectrum resolution and imaging resolution. Optical surfaces of all reflecting mirrors of the imaging spectrometer are spherical surfaces and have a common sphere center, so not only can optical machining difficulty and machining cost be reduced, but also adjustment and testing of engineering optics are facilitated.

Description

technical field [0001] The invention relates to the technical field of imaging spectroscopy, in particular to a grating dispersion imaging spectrometer, in particular to an imaging spectrometer based on a concentric off-axis double reflection system. Background technique [0002] Imaging spectroscopy technology originated from the multispectral remote sensing technology in the early 1980s. It is a new multi-dimensional information acquisition technology that combines imaging technology and spectral technology. It can obtain the spatial information and spectral information of the detected target. Due to its excellent information acquisition ability, it has been widely used in space exploration and surface observation, and has gradually become a powerful means of optical remote sensing detection. [0003] Compared with other types of imaging spectrometers, the grating dispersion imaging spectrometer has the advantages of high spectral resolution, wide band range, uniform dispe...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/28G01J3/02
Inventor 唐义陈廷爱张丽君郑成南一冰
Owner BEIJING INSTITUTE OF TECHNOLOGYGY
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