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Method for rapidly nondestructively detecting wheat hardness based on near infrared spectrum technology and application

A technology of near-infrared spectroscopy and near-infrared spectrometer, applied in measuring devices, material analysis through optical means, instruments, etc., can solve the problems of long detection period, high detection cost, cumbersome operation, etc., and achieve fast detection speed and objectivity High, improve the effect of detection efficiency

Inactive Publication Date: 2015-11-11
HEILONGJIANG UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In order to solve the problems of long detection period, high detection cost, low efficiency, and cumbersome operation in the prior art, the present invention provides a method for rapid and non-destructive detection of wheat hardness based on near-infrared spectroscopy. The technical scheme adopted is as follows:

Method used

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  • Method for rapidly nondestructively detecting wheat hardness based on near infrared spectrum technology and application
  • Method for rapidly nondestructively detecting wheat hardness based on near infrared spectrum technology and application
  • Method for rapidly nondestructively detecting wheat hardness based on near infrared spectrum technology and application

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0041] 1. The samples selected in this example are the 2013 wheat samples collected by the Institute of Agricultural Product Quality and Safety of the Heilongjiang Academy of Agricultural Sciences from the main wheat producing areas across the country, and a total of 111 samples were collected.

[0042] The spectral data is obtained by using a near-infrared spectrum analyzer. The specific process is: control the temperature at about 25°C at room temperature during scanning; when loading the sample, the cup mouth needs to be scraped flat after the sample is placed in the sample cup, so that the sample surface and the edge of the sample cup are as flat as possible;

[0043]The sample was placed in a prototype slot with a diameter of 35mm and a depth of 10mm for scanning, the scanning interval was 8nm, and 2 scans were performed to generate 262 spectral points, such as figure 2 NIR spectra of 4 wheats.

[0044] 2. Carry out routine experiments on the wheat samples scanned by the...

Embodiment 2

[0053] 1. Steps 1-3 are the same as steps 1-3 in Example 1.

[0054] 2. Use the raw spectra of the unprocessed calibration set samples to establish a radial basis function (RBF) neural network model, and use the predicted set samples to test the RBF model. The RBF of the model 2 was 0.79, the RPD was 2.19, and the SEP was 4.30.

Embodiment 3

[0056] 1. Steps 1-3 are the same as steps 1-3 in Example 1.

[0057] 2. Use standard normal variable transformation SNV to optimize the spectral data of all samples to eliminate the influence of correction scattering, and then obtain the second derivative spectrum by mathematical calculation method.

[0058] 3. Use the calibration set samples to establish a partial least squares (PLS) model, and use the prediction set samples to verify and correct the PLS model. The R of the model 2 was 0.85, the RPD was 2.57, and the SEP was 3.66.

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Abstract

The invention discloses a method for rapidly nondestructively detecting wheat hardness based on a near infrared spectrum technology and application and belongs to the technical field of grain quality detection. The method comprises the steps of establishing a near infrared detection model of the wheat hardness, utilizing a near infrared spectrometer to scan to-be-detected wheat samples, obtaining a sample near infrared spectrum curve, and after performing data processing on the near infrared spectrum curve, determining the hardness of the to-be-detected wheat samples by utilizing the detection model according to obtained data. The method is low in cost, free of pollution, quick in detection speed and high in objectivity, online analysis can be achieved, the method is subjected to geographical limitations, and real-time detection can be performed.

Description

technical field [0001] The invention relates to a method and application for rapid non-destructive testing of wheat hardness based on near-infrared spectroscopy technology, and belongs to the technical field of grain quality testing. Background technique [0002] The softness and hardness of wheat grain texture is an important indicator for evaluating the processing quality and eating quality of wheat, and is closely related to wheat breeding and trade prices. One of the important breeding goals of breeders. Wheat hardness is defined as the resistance to breaking the kernel, that is, the force required to break the kernel. Firmness is determined by the strength of the binding between the protein matrix and starch in the endosperm cells, which is genetically controlled. The milling quality of wheat is closely related to the grain hardness. The change of wheat hardness can greatly change the quantity and quality of WIP of each system, the working efficiency of each equipment...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/359G01N21/3563
Inventor 孙来军惠光艳王佳楠
Owner HEILONGJIANG UNIV
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