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Yellow LED material on Si substrate and manufacturing method thereof

A LED structure and substrate technology, applied in the field of microelectronics, can solve the problems of complex InGaN quantum well growth process, degraded GaN crystal quality, and degraded device performance, so as to avoid large lattice mismatch of materials, improve quality, and reduce production cost effect

Active Publication Date: 2017-08-25
XIDIAN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This scheme uses InGaN / GaN quantum wells as the active region. Since yellow light requires a higher In composition, a high In composition requires a low growth temperature, and a high In composition will generate greater stress in the material. This will degrade the crystalline quality of GaN and degrade device performance
Moreover, the growth process of InGaN quantum wells is complicated, the growth efficiency is low, and the cost is high.

Method used

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  • Yellow LED material on Si substrate and manufacturing method thereof
  • Yellow LED material on Si substrate and manufacturing method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0025] Embodiment 1, making the C doping concentration is 1×10 18 cm -3 , Si doping concentration is 3×10 18 cm -3 n-type GaN active layer LED material.

[0026] Step 1, performing heat treatment on the substrate substrate.

[0027] Put the Si substrate in the metal organic compound chemical vapor deposition MOCVD reaction chamber, and pass the mixed gas of hydrogen and ammonia into the reaction chamber, and the vacuum degree in the reaction chamber is less than 2×10 -2 Torr, under the conditions that the substrate heating temperature is 1000° C., the time is 7 minutes, and the pressure of the reaction chamber is 45 Torr, heat treatment is performed on the substrate.

[0028] Step 2, growing an AlN nucleation layer.

[0029] Lower the temperature of the heat-treated substrate to 600°C, feed the aluminum source with a flow rate of 5 μmol / min, hydrogen gas with a flow rate of 1200 sccm, and ammonia gas with a flow rate of 1200 sccm into the reaction chamber, and grow thickn...

Embodiment 2

[0034] Embodiment 2, making C doping concentration is 1×10 17 cm -3 , Si doping concentration is 5×10 17 cm -3 n-type GaN active layer LED material.

[0035] The implementation steps of this example are as follows:

[0036] In step A, the Si substrate is placed in a MOCVD reaction chamber, and a mixed gas of hydrogen and ammonia is introduced into the reaction chamber, and the vacuum degree in the reaction chamber is less than 2×10 -2 Under the conditions of Torr, the substrate heating temperature is 830° C., the time is 5 minutes, and the pressure of the reaction chamber is 30 Torr, the substrate substrate is heat treated.

[0037] Step B, reduce the temperature of the heat-treated substrate to 530°C, feed the aluminum source with a flow rate of 5 μmol / min, hydrogen gas with a flow rate of 1000 sccm and ammonia gas with a flow rate of 1000 sccm into the reaction chamber, and keep the pressure at 20 Torr A low-temperature AlN nucleation layer with a thickness of 10 nm was...

Embodiment 3

[0040] Embodiment 3, making C doping concentration is 1×10 19 cm -3 , Si doping concentration is 3×10 19 cm -3 n-type GaN active layer LED material.

[0041] The implementation steps of this example are as follows:

[0042] Step 1: performing heat treatment on the base substrate.

[0043] The Si substrate is placed in the metal organic chemical vapor deposition MOCVD reaction chamber, and a mixed gas of hydrogen and ammonia is introduced into the reaction chamber for heat treatment. The process conditions are as follows:

[0044] The vacuum degree of the reaction chamber: less than 2×10 -2 Torr;

[0045] Substrate heating temperature: 1150°C;

[0046] Nitriding time: 10min;

[0047] Reaction chamber pressure: 700 Torr.

[0048] Step 2, growing an AlN nucleation layer.

[0049] A low-temperature AlN nucleation layer with a thickness of 200nm is grown on the heat-treated substrate, and the process conditions are as follows:

[0050] Reaction chamber temperature: 720°C...

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Abstract

A GaN base material for manufacturing a yellow-light LED comprises a p-shaped GaN layer, an active layer, a nucleating layer, and a substrate arranged from top to bottom, the active layer using a C-doped and Si-doped n-shaped GaN layer, to introduce the deep energy level of C into the n-shaped GaN layer. By means of the GaN base material and the preparation method therefor, a production process can be simplified, growing efficiency can be improved, costs can be reduced, and the performance of an LED device can be improved.

Description

technical field [0001] The invention belongs to the technical field of microelectronics and relates to a semiconductor material, which can be used for making GaN yellow LED products. [0002] technical background [0003] Ш-V group nitride semiconductor materials have the advantages of direct band gap, high thermal conductivity, high electron saturation mobility, high luminous efficiency, high temperature resistance and radiation resistance, and have made great progress in the fields of optoelectronics and microelectronics. It has great application prospects in short-wavelength blue-ultraviolet light-emitting devices, microwave devices, and high-power semiconductor devices. By adjusting the composition of In, theoretically speaking, full coverage of visible light wavelengths can be achieved. [0004] In 2014, Jianli Zhang et al. proposed a plan to grow the full structure of InGaN-based yellow light-emitting diodes on Si substrates, see High brightness InGaN-based yellow light...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L33/32
CPCH01L33/32
Inventor 郝跃任泽阳许晟瑞李培咸张进成姜腾蒋仁渊马晓华
Owner XIDIAN UNIV