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A kind of three-dimensional memory and its preparation method

A memory, three-dimensional technology, applied in electrical components and other directions, can solve the problem of low space utilization of gating switches, and achieve the effects of reducing leakage current and thermal crosstalk, simplifying process steps, and reducing cell surface.

Active Publication Date: 2018-08-17
HUAZHONG UNIV OF SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] Aiming at the problems of needing additional gating switches and low space utilization in the three-dimensional memory in the prior art, the present invention aims to solve the above problems

Method used

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  • A kind of three-dimensional memory and its preparation method
  • A kind of three-dimensional memory and its preparation method
  • A kind of three-dimensional memory and its preparation method

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Experimental program
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preparation example Construction

[0071] Please refer to Figures 1-15. The present invention also provides a method for preparing a multi-layer three-dimensional memory, which is described by taking a double-layer memory as an example. The method includes:

[0072] Step 1: Carry out photolithography on the insulating or semiconductor substrate 100, and then prepare a layer of lower electrode 101 in the vertical direction on the substrate 100 after photolithography, and peel off to obtain the lower electrode 101 corresponding to the photolithographic pattern. The electrode material can be metal or non-metal with good conductivity, such as silver, copper, titanium-tungsten alloy, graphene, etc. The thickness of the lower electrode 101 is 100-500nm, and the structure after step 1 is shown in Figure 1;

[0073] Step 2: prepare another layer of lower electrothermal insulation layer 102, the material of the lower electrothermal insulation layer 102 is: nitride, oxide, sulfide or a mixture of two or more materials, th...

Embodiment 1

[0086] Step 1: Carry out photolithography on the silicon substrate with a layer of silicon dioxide insulating layer on the surface, and then prepare a layer of lower electrode on the substrate after photolithography. After peeling off, a strip-shaped lower electrode in the vertical direction is obtained. The electrode thickness is 100nm, and the lower electrode material is silver;

[0087] Step 2: Prepare another layer of lower electrothermal insulating layer, the lower insulating layer is slightly smaller than the lower electrode on the substrate, so that the lower electrode is partially exposed, the thickness is 500nm, and the material is SiO 2 ;

[0088] Step 3: Use micro-nano processing technology to prepare small holes in the middle of the lower electrothermal insulation layer, with a diameter of 50nm and a depth of 500nm;

[0089] Step 4: using chemical vapor deposition to fill the lower n-type semiconductor material plug column, the thickness of the n-type semiconducto...

Embodiment 2

[0100] Step 1: Carry out photolithography on the silicon substrate with a layer of silicon dioxide insulating layer on the surface, and then prepare a layer of lower electrode on the substrate after photolithography. After peeling off, a strip-shaped lower electrode in the vertical direction is obtained. The electrode thickness is 100nm, and the bottom electrode material is titanium;

[0101] Step 2: Prepare another layer of lower electrothermal insulating layer, the lower insulating layer is slightly smaller than the lower electrode on the substrate, so that the lower electrode is partially exposed, the thickness is 500nm, and the material is SiO 2 ;

[0102] Step 3: Use micro-nano processing technology to prepare small holes in the middle of the lower electrothermal insulation layer, with a diameter of 50nm and a depth of 500nm;

[0103] Step 4: using chemical vapor deposition to fill the lower n-type semiconductor material plug column, the thickness of the n-type semicondu...

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Abstract

The purpose of the present invention is to provide a three-dimensional memory and its preparation method. The three-dimensional memory of this invention is formed by vertical stacking of multi-layer memory, each layer includes: strip electrode; electric thermal insulation layer; small hole in the middle of the electric thermal insulation layer; The n-type semiconductor material plug column and the p-type storage material plug column in the hole; the memory can independently read and write each unit. The memory selects a p-type storage medium and an n-type semiconductor material to form a pn junction, and the selected p-type storage material has dual functions, being both a storage medium and a part of a gate tube. The memory comes with a gating transistor, and no additional transistor is used as a gating switch, which can greatly reduce the cell area and increase the storage density, and at the same time effectively reduce leakage current and thermal crosstalk.

Description

technical field [0001] The invention belongs to the technical field of micro-nano electronics, and in particular relates to a three-dimensional memory. Background technique [0002] It is currently a stage of explosive development of 3D memory technology. At present, three-dimensional memory such as 3D-NAND, 3D-RRAM, and 3D X-point has been proposed in the world. The three-dimensional memory has a vertical three-dimensional structure and is formed by stacking multiple layers of memory, which can effectively use the space area and greatly increase the storage density. It is the inevitable direction of future memory development. [0003] Phase-change memory (PCRAM) is an element based on the Ovsinski effect, and its core is a chalcogenide-based phase-change material. The storage medium of PCRAM can realize reversible transition between amorphous state and crystalline state under thermal induction. When the storage medium is in amorphous state and crystalline state, it will s...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L45/00
CPCH10N70/24H10N70/231H10N70/011H10N70/00
Inventor 缪向水颜柏寒童浩闫鹏
Owner HUAZHONG UNIV OF SCI & TECH