AlN template, preparation method of AlN template and semiconductor device on AlN template
A semiconductor and nitride semiconductor technology, applied in semiconductor devices, electrical components, circuits, etc., can solve the problems of poor wavelength uniformity of epitaxial wafers, large warpage of epitaxial wafers, and large compressive stress of GaN epitaxy, and achieve improved wavelength uniformity, Good crystal quality, the effect of increasing the lattice constant
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0032] In order to make the object, technical solution and advantages of the present invention clearer, the implementation manner of the present invention will be further described in detail below in conjunction with the accompanying drawings.
[0033] figure 2 A kind of AlN template provided by the first embodiment of the present invention is shown, such as figure 2 As shown, the AlN template includes a substrate 10 and an AlN thin film deposited on the substrate 10 . Wherein, the AlN thin film includes a first AlN layer 11 deposited on a substrate 10, and the first AlN layer 11 is doped with oxygen (O). Moreover, the oxygen content in the first AlN layer 11 gradually decreases from the interface between the first AlN layer 11 and the substrate 10 to the surface of the first AlN layer 11 .
[0034] Wherein, the substrate 10 includes but not limited to Si, SiC, sapphire, ZnO, GaAs, GaP, MgO, Cu and W substrates.
[0035]Part of the O atoms doped in the first AlN layer 11 ...
PUM
Property | Measurement | Unit |
---|---|---|
thickness | aaaaa | aaaaa |
thickness | aaaaa | aaaaa |
thickness | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com