Fin-type field-effect transistor with Omega-shaped top gate structure and preparation method of fin-type field-effect transistor
A fin field effect and transistor technology, which is applied in semiconductor/solid-state device manufacturing, semiconductor devices, electrical components, etc., can solve the problems of lack of top gate channel cross-sectional area, small equivalent Fin thickness, large leakage current, etc. The effect of low cost, high on-state current, and small source-drain series resistance
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[0082] The present invention will be described in detail below in conjunction with the accompanying drawings and specific examples.
[0083] The preparation of N-type Ω-type top-gate structure fin field-effect transistors on SOI substrates can be realized according to the following steps:
[0084] 1) On the P-type (100) SOI substrate, the top silicon film will be thinned to 250nm by HNA solution, LPCVDSiO 2 100nm as mask layer 1, such as figure 1 shown;
[0085] 2) Define the mask pattern of the channel region with a length of 100nm and a width of 50nm by electron beam lithography, that is, the line width of the top of the Ω-type Fin is 50nm, using photoresist as a mask, and ICP etching mask layer 1 to form a rectangular Fin mask film, the line width of the rectangular Fin mask is 50nm, which is the line width at the top of the Ω-type Fin, and the adhesive is removed, such as figure 2 shown;
[0086] 3) LPCVD 300nm silicon nitride is used as the mask layer 2, the mask la...
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