Solid barrier needle point contact type scanning tunnel microscope
A scanning tunneling and microscope technology, applied in the field of scanning probe microscopy, can solve the problems of limited selection of needle tips, unfavorable STM, false atoms, etc., to avoid troublesome and tedious processes, improve STM resolution, and improve the effect of the probability of success.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0045] Contour Elastic Contact Scanning Tunneling Microscope
[0046] The contour elastic contact scanning tunneling microscope is one of the various implementations of the elastic contact scanning tunneling microscope. Its characteristic feature is that the distance between the probe station 13 and the sample stage 9 remains constant, and the barrier needle tip formed by the conductive tip 3 and the solid dielectric film 2 fluctuates with the fluctuation of the surface of the conductive sample, which can also be referred to as a contour contact mode, which is similar to The probe-sample stage spacing remains unchanged for non-contact mode STM similarly.
[0047] The obtained varying output current still reflects the electronic density of states distribution on the surface of the conducting sample. The contour contact mode STM is similar to the non-contact mode STM, and has complementary characteristics and advantages in the mode.
[0048] In the specific operation, first us...
Embodiment 2
[0056] Constant force elastic contact scanning tunneling microscope
[0057] In Example 1, the CSTM in the constant-height contact mode is not suitable for samples with large surface fluctuations, and may damage the probe or the sample. For this reason, the distance between the probe and the sample needs to fluctuate with the fluctuation of the sample surface. The adopted solution is constant force mode CSTM with PID feedback control.
[0058] At this time, the elastic cantilever needle body 12 including piezoresistive material or piezoelectric material can be selected to sense the force between the solid barrier needle tip and the conductive sample 4 . Resistance of piezoresistive or piezoelectric needles R x (t) or voltage V x (t), connected to the detection circuit through two electrodes, such as a bridge circuit, the output of the bridge is connected to the PID controller 11 that adjusts the distance between the probe station 13 or the sample stage 9, and makes the ou...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com