Low temperature X ray induced thermoluminescence spectrum measuring device
A measurement device, thermoluminescence technology, applied in the direction of measurement devices, material analysis using wave/particle radiation, instruments, etc., can solve the problems of affecting the content of analysis information, poor spectral repeatability, detection, etc., to achieve good spectral repeatability, The effect of enriching data information and reducing the overall volume
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[0072] Figure 6 It is the schematic diagram of the X-Ray induced low-temperature thermoluminescence test system, in which the maximum voltage of the X-Ray light source is 90Kv, and the current is 2-2.5mA; the temperature range of the sample chamber is 77K (liquid nitrogen temperature)-500K, and the heating rate is <6K / min (adjustable); the detection sensitivity of the spectrometer is 26 photons (@250nm). The main indicators of the final test system are shown in the table below:
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