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Device for testing normal spectral emissivities of infrared transparent materials

A technology of spectral emissivity and transparent materials, which is applied in the field of infrared transparent material normal spectral emissivity testing devices, can solve the problems of easy cracking of samples, poor measurement result accuracy, single testable materials, etc., to achieve accurate measurement and ensure accurate measurement , the effect of uniform heating

Active Publication Date: 2017-06-13
杭州光学精密机械研究所
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  • Abstract
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  • Application Information

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Problems solved by technology

[0005] The purpose of the present invention is to solve the problems of single testable material, easy cracking of samples under high temperature, and poor accuracy of measurement results in the above-mentioned existing material emissivity testing technology, and propose a normal spectral emissivity testing device for infrared transparent materials. The device has the characteristics of being able to measure multi-wavelength infrared transparent materials, the sample is not easy to be damaged under high temperature, and the measurement result is highly accurate

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  • Device for testing normal spectral emissivities of infrared transparent materials
  • Device for testing normal spectral emissivities of infrared transparent materials

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Embodiment 1

[0031] like figure 1 and 2 As shown in the figure, it can be seen from the figure that the infrared transparent material normal spectral emissivity test device of the present invention includes a sample heating and temperature control subsystem, a vacuum sealing subsystem, a Fourier transform infrared spectrometer 5, a computer 6 and a standard black body 4; the sample The heating and temperature control subsystem includes CO for heating 2 Laser 1, heating optical path, and CO2 The He-Ne laser 21 for calibration and the third movable mirror 25 are placed in parallel with the laser 1; the high temperature and low radiation sample chamber includes a brass wall 10, a cooling copper tube 11 installed around the high temperature and low radiation sample chamber, and the interior The optical baffle 17 above, the aluminum rod frame 13 and platinum wire 28 fixed on the metal sealing chamber 9 for supporting the sample, and the platinum-rhodium thermocouple 14 mounted on the aluminum ...

Embodiment 2

[0044] The difference between this embodiment 2 and embodiment 1 is:

[0045] The sample to be tested 22 is a long-wave infrared transparent material.

[0046] Replace the beam expander lens 15 of the laser beam space shaping part with CaF 2 The beam expander lens made of material is fixed on the screw hole under the metal sealing cavity 9 .

[0047] The above-mentioned measurement step 4 is changed to: move the first movable mirror 23 to the described heating optical path, so that the laser light emitted by the 1064nm ultraviolet laser 2 passes through the 1064nm laser light emitted by the described ultraviolet laser 2 through the described 3 times. The frequency converter obtains a 355nm laser, and the first movable mirror 23 reflects the 355nm laser into the heating optical path, heats the sample to be tested, and then measures;

[0048] The present invention first utilizes CO at two different wavelengths 2 For laser 1 and ultraviolet laser 2, as long as the first movabl...

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Abstract

Provided is a device for testing normal spectral emissivities of infrared transparent materials. The device includes a sample heating and temperature-control subsystem, a vacuum sealing subsystem, a Fourier infrared spectrometer, a computer and a standard blackbody. According to the device, accurate measurement of the emissivities of medium-wave, short-wave and long-wave infrared transparent materials at the temperature from 300K to 800K can be achieved, the device has the advantages of being high in utilization rate and easy and convenient to operate, and the spectral emissivities of different kinds of infrared transparent materials at medium and high temperatures can be tested.

Description

technical field [0001] The invention relates to the measurement of thermal physical property parameters of materials, in particular to a device for measuring the normal spectral emissivity of infrared transparent materials. Background technique [0002] Emissivity is a physical quantity that characterizes the radiation characteristics of various material surfaces. It is defined as the ratio of the radiation capability of the material surface to the radiation capability of a black body at the same temperature. The emissivity test has a very broad application background in the fields of engineering and scientific research, such as the aerospace industry and national defense scientific research, which are of great value. [0003] At present, the most accurate measurement scheme for measuring low-emissivity infrared transparent materials is [High temperature optical of oxide dome materials] proposed by Raymond M. et al. in the United States. The test device they built chooses CO...

Claims

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Application Information

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IPC IPC(8): G01J5/00
CPCG01J5/0003
Inventor 毛小建胡旭冯明辉姜本学张龙
Owner 杭州光学精密机械研究所
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