A three-dimensional scanning measurement device and method suitable for strongly reflective surfaces
A technology of three-dimensional scanning and measurement methods, applied in the direction of measurement devices, optical devices, instruments, etc., can solve the problems of complex measurement process, poor mixed surface effect, and increased measurement complexity, so as to achieve high flexibility and improve vision The effect of displaying force and measurement accuracy and enhancing environmental adaptability
Inactive Publication Date: 2020-01-14
TIANJIN UNIV
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Among them, the multi-angle method is sometimes difficult to find a suitable angle so that the highlight positions in different fields of view do not overlap; the polarization method needs to add a polarizer and the measurement process is more complicated, which will increase the complexity of the measurement; the two-color model method needs to use the method of spatial clustering Separate the highlight and diffuse reflection branches, which also makes this method greatly affected by the surface noise of the measured object; the fringe reflection method is suitable for 3D reconstruction of pure specular objects, but not good for mixed surfaces; and the multiple exposure method It only solves the problem of saturation of highlight information in captured images, but fails to correct the center shift of stripes caused by highlights
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[0092] In this implementation, three-dimensional scanning measurements were carried out on strongly reflective surfaces of different materials, and by adjusting the illumination intensity, angle and other environments, the three-dimensional shape measurement of strongly reflective surfaces was finally realized. Experimental results such as Figure 6(a) to Figure 6(f) shown. Figure 6(a), Figure 6(c) and Figure 6(e) are the depth maps of the measured object level of three materials obtained by using the traditional raster projection three-dimensional scanning measurement technology. It can be seen that the surface of the measured object is due to the presence of local highlights Reflection, resulting in the lack of local point clouds in the bit-depth map after 3D scanning, and the inability to obtain complete 3D coordinate information, which have been marked with white circles in the figure; and using the 3D scanning measurement device and method based on the DMD camera, just I...
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The invention discloses a three-dimensional scan measuring method suitable for a strong reflection surface. A three-dimensional scan measuring device based on a DMD camera is adopted, the device including a DMD camera with no change of a linear space and a digital projection device DLP4500, wherein the DMD camera includes a digital micromirror device (DMD), a CMOS image detector, a TIR prism, twolenses and a processor. The method comprises the following measuring steps: firstly, through a four step phase-shift method, the digital projection device DLP4500 projects sine grating patterns with different phases onto a to-be-measured strong reflection surface; secondly, through the DMD camera, adaptive high dynamic range imaging of incident light is realized, and finally obtaining a clear to-be-measured image; and thirdly, three-dimensional measurement of the to-be-measured image is realized through a phase method based on grating projection. The three-dimensional point cloud missing problem caused by excessive local exposure during measurement of three-dimensional geometrical characteristics of a strong reflection surface is solved fundamentally, and the environment adaptability is improved.
Description
technical field [0001] The invention belongs to the field of mechanical testing, and relates to a three-dimensional scanning measurement method for strongly reflective surfaces based on structured light, in particular to a three-dimensional scanning measurement device and method for strongly reflective surfaces based on adaptive high dynamic range imaging. Background technique [0002] Structured light 3D scanning measurement technology has been widely used in the field of advanced manufacturing due to its advantages of non-contact, high efficiency, high precision and rich point cloud information. Its large amount of measurement information is the basic guarantee and core content of the new manufacturing mode. It is mainly used to evaluate the manufacturing quality of products, precise positioning in parts assembly, etc.; it is further implemented in reverse engineering, feedback design quality and auxiliary design, etc. At present, the mature structured light 3D scanning me...
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IPC IPC(8): G01B11/00
Inventor 冯维张福民曲兴华
Owner TIANJIN UNIV