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A kind of reverse resistance type igbt and its manufacturing method

A reverse-resistance type and N-type technology, which is applied in the field of power semiconductor devices, can solve the problems affecting the compromise characteristics of device conduction voltage drop and switching loss, poor reverse blocking ability of FS-IGBT structure, and short-circuit safe working area of ​​devices. To achieve the effect of improving the carrier concentration distribution, enhancing the enhancement effect, and excellent reverse blocking performance

Active Publication Date: 2021-05-14
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] On the one hand, the implementation of method (2) will increase the gate capacitance of the device, resulting in a decrease in the switching speed of the device and an increase in switching loss, which will affect the compromise between the conduction voltage drop and switching loss of the device. On the other hand, the large channel Density will also increase the saturation current density of the device, deteriorating the short-circuit safe operating area of ​​the device
[0009] In addition, the gate oxide layer in the trench gate structure of the IGBT device is formed in the trench by one-time thermal oxidation. In order to ensure a certain threshold voltage, the thickness of the entire gate oxide layer is required to be small. However, the capacitance of the MOS and the oxide layer The thickness is inversely proportional to the thickness, which makes the thin gate oxide layer thickness in traditional IGBT devices will also significantly increase the gate capacitance of the device; at the same time, the electric field concentration effect at the bottom of the trench will cause the breakdown voltage of the device to decrease, resulting in poor reliability of the device ; Moreover, IGBT still has the disadvantage of poor reverse blocking ability of FS-IGBT structure, so it is difficult to be directly applied to applications that require IGBT to have reverse blocking ability

Method used

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  • A kind of reverse resistance type igbt and its manufacturing method
  • A kind of reverse resistance type igbt and its manufacturing method
  • A kind of reverse resistance type igbt and its manufacturing method

Examples

Experimental program
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Effect test

Embodiment 1

[0086] This embodiment provides a reverse resistance type IGBT, the cell structure of which is as follows image 3 As shown, it includes a collector metal 17, a P-type collector region 16, an N-type electric field stop layer 15, an N-type drift region 10 and an emitter metal 1 stacked sequentially from bottom to top; it is characterized in that: the N-type The drift region 10 has an N+ emitter region 3, a P+ emitter region 4, a P-type base region 5, an N-type charge storage layer 6 and a trench gate structure; the top layer of the N-type drift region 10 also has a first floating P Type body region 9, the first floating P-type body region 9 is located on one side of the trench gate structure and connected to it, N+ emitter region 3, P+ emitter region 4, P-type base region 5, and N-type charge storage layer 6 are located The other side of the trench gate structure; the N+ emitter region 3 and the P+ emitter region 4 are in contact with each other and are located side by side und...

Embodiment 2

[0088] This embodiment provides a reverse resistance type IGBT, the cell structure of which is as follows Figure 4 As shown, it includes: a collector metal 17, a P-type collector region 16, an N-type electric field stop layer 15, an N-type drift region 10 and an emitter metal 1 stacked sequentially from bottom to top; it is characterized in that: the N Type drift region 10 has N+ emitter region 3, P+ emitter region 4, P-type base region 5, N-type charge storage layer 6, split trench gate structure and trench collector structure; N+ emitter region 3 and P+ emitter region 4 They are in contact with each other and are located side by side under the emitter metal 1 and connected to the emitter metal 1; the P-type base region 5 is located under the N+ emitter region 3 and the P+ emitter region 4 and is connected to the two, and the N-type charge storage layer 6 is located on the P between the N-type base region 5 and the N-type drift region 10; the split trench gate structure incl...

Embodiment 3

[0090] This embodiment provides a reverse resistance type IGBT, the cell structure of which is as follows Figure 5 As shown, the structure of this embodiment is the same as that of Embodiment 1 except that a P-type layer 12 connected to the trench bottom of the trench collector structure is provided in this embodiment. This embodiment further improves the reverse breakdown voltage of the device.

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Abstract

A reverse resistance type IGBT and a manufacturing method thereof belong to the technical field of power semiconductor devices. The present invention introduces a floating P-type body region on one side of the trench gate and introduces a trench collector structure into the collector region and the field stop layer, without affecting the threshold voltage and turn-on of the IGBT device, and improves the The forward breakdown voltage of the device; reduce the gate-collector capacitance, improve the adverse effects of the Miller effect; reduce the overall gate capacitance, increase the switching speed of the device, reduce the switching loss of the device, and improve the traditional CSTBT device positive The trade-off relationship between conduction voltage drop and turn-off loss; avoid current, voltage oscillation and EMI problems in the dynamic process of device turn-on, improve device reliability; improve the carrier enhancement effect of the emitter terminal of the device, and improve the carrier in the drift region The carrier concentration distribution further improves the compromise between forward conduction voltage drop and turn-off loss; improves the reverse breakdown voltage of the device, and obtains excellent reverse blocking performance while ensuring good forward characteristics of the device.

Description

technical field [0001] The invention belongs to the technical field of power semiconductor devices, and relates to an insulated gate bipolar transistor (IGBT), in particular to a reverse resistance IGBT and a manufacturing method thereof. Background technique [0002] An insulated gate bipolar transistor (IGBT) is a power semiconductor device composed of a MOS field effect transistor (MOSFET) and a bipolar junction transistor (BJT), which can be equivalent to a MOSFET driven by a bipolar junction transistor. IGBT combines the working mechanism of MOSFET structure and bipolar junction transistor. It not only has the advantages of easy driving of MOSFET, low input impedance and fast switching speed, but also has the advantages of high on-state current density, low conduction voltage, low loss and stability of power transistor. The advantages of good performance make it significantly improve the performance of power electronic systems in applications. At present, IGBT has beco...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L29/739H01L21/331H01L29/06
CPCH01L29/0603H01L29/0684H01L29/66325H01L29/7393
Inventor 张金平赵倩刘竞秀李泽宏任敏张波
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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