A kind of reverse resistance type igbt and its manufacturing method
A reverse-resistance type and N-type technology, which is applied in the field of power semiconductor devices, can solve the problems affecting the compromise characteristics of device conduction voltage drop and switching loss, poor reverse blocking ability of FS-IGBT structure, and short-circuit safe working area of devices. To achieve the effect of improving the carrier concentration distribution, enhancing the enhancement effect, and excellent reverse blocking performance
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Embodiment 1
[0086] This embodiment provides a reverse resistance type IGBT, the cell structure of which is as follows image 3 As shown, it includes a collector metal 17, a P-type collector region 16, an N-type electric field stop layer 15, an N-type drift region 10 and an emitter metal 1 stacked sequentially from bottom to top; it is characterized in that: the N-type The drift region 10 has an N+ emitter region 3, a P+ emitter region 4, a P-type base region 5, an N-type charge storage layer 6 and a trench gate structure; the top layer of the N-type drift region 10 also has a first floating P Type body region 9, the first floating P-type body region 9 is located on one side of the trench gate structure and connected to it, N+ emitter region 3, P+ emitter region 4, P-type base region 5, and N-type charge storage layer 6 are located The other side of the trench gate structure; the N+ emitter region 3 and the P+ emitter region 4 are in contact with each other and are located side by side und...
Embodiment 2
[0088] This embodiment provides a reverse resistance type IGBT, the cell structure of which is as follows Figure 4 As shown, it includes: a collector metal 17, a P-type collector region 16, an N-type electric field stop layer 15, an N-type drift region 10 and an emitter metal 1 stacked sequentially from bottom to top; it is characterized in that: the N Type drift region 10 has N+ emitter region 3, P+ emitter region 4, P-type base region 5, N-type charge storage layer 6, split trench gate structure and trench collector structure; N+ emitter region 3 and P+ emitter region 4 They are in contact with each other and are located side by side under the emitter metal 1 and connected to the emitter metal 1; the P-type base region 5 is located under the N+ emitter region 3 and the P+ emitter region 4 and is connected to the two, and the N-type charge storage layer 6 is located on the P between the N-type base region 5 and the N-type drift region 10; the split trench gate structure incl...
Embodiment 3
[0090] This embodiment provides a reverse resistance type IGBT, the cell structure of which is as follows Figure 5 As shown, the structure of this embodiment is the same as that of Embodiment 1 except that a P-type layer 12 connected to the trench bottom of the trench collector structure is provided in this embodiment. This embodiment further improves the reverse breakdown voltage of the device.
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