A method of making high precision mems inertial sensor using soi sheet
An inertial sensor, high-precision technology, applied in directions such as navigation through speed/acceleration measurement, can solve the problems of low precision of inertial sensors, low cross-axis sensitivity, etc., achieve low cross-sensitivity, low mechanical and thermal noise, and simplify the production process Effect
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Embodiment 1
[0045] The material used is an SOI wafer, the thickness of the device layer 7 is 500 μm, the thickness of the sacrificial layer 8 is 1 μm, and the thickness of the supporting layer 9 is 100 μm. The device layer 7 can be a silicon layer, and the sacrificial layer 8 can be SiO 2 layer, the supporting layer 9 may be a silicon layer.
[0046] The realization technique of a kind of high-precision MEMS inertial sensor provided by the present invention comprises the following steps:
[0047] (1) complete the making of metal capacitor pole plate 3 and package contact point 1 on SOI silicon chip device layer 7, as Figure 2a shown. Further include the following steps:
[0048] (1-1) Carry out organic cleaning and oxygen plasma cleaning to the silicon wafer;
[0049] (1-2) Electron beam evaporation is used to plate titanium 40nm and gold 200nm on the surface of the silicon wafer (both refer to the thickness);
[0050] (1-3) performing photolithography on the surface of the metal la...
Embodiment 2
[0075] The material used is an SOI wafer, the thickness of the device layer 7 is 400 μm, the thickness of the sacrificial layer 8 is 2 μm, and the thickness of the supporting layer 9 is 50 μm.
[0076] The realization technique of a kind of high-precision MEMS inertial sensor provided by the present invention comprises the following steps:
[0077] (1) On the device layer 7 of the SOI silicon wafer, the fabrication of the metal capacitor plate 3 and the packaging contact point 1 is completed. Further include the following steps:
[0078] (1-1) Carry out organic cleaning and oxygen plasma cleaning to the silicon wafer;
[0079] (1-2) Evenly apply double-layer glue on the surface of the silicon wafer, after exposure and development, rinse with flowing deionized water for 5 minutes;
[0080] (1-3) Surface treatment of the sample, such as oxygen plasma cleaning, to ensure the cleanliness of the sample surface;
[0081] (1-4) Electron beam evaporation is used to plate titanium 40n...
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