Conductor structure, capacitor array structure and preparation method

A technology of capacitor structure and conductor structure, which is applied in semiconductor/solid-state device manufacturing, circuits, transistors, etc., and can solve problems such as increased conductivity and limited grain size of polysilicon

Active Publication Date: 2019-09-06
CHANGXIN MEMORY TECH INC
View PDF13 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In view of the shortcomings of the prior art described above, the purpose of the present invention is to provide a conductor structure based on polysilicon process, a capacitor array structure and their respective preparation methods, which are used to solve the limitations of improving polysilicon crystal grain size and polysilicon crystallization in the prior art. Problems such as increased conductivity caused by too small particle size

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Conductor structure, capacitor array structure and preparation method
  • Conductor structure, capacitor array structure and preparation method
  • Conductor structure, capacitor array structure and preparation method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0115] Such as Figure 1~4 As shown, the present invention provides a method for preparing a conductor structure based on a polysilicon process, comprising the steps of:

[0116] First, if figure 1 S1 and Figure 2~3 As shown, step 1) is performed, a substrate 200 is provided, and the cavity structure 201 is formed in the substrate 200 .

[0117] Specifically, this step provides a structural basis for subsequent formation of a conductor filling structure, wherein the substrate 200 can be a single material layer, such as a silicon material layer, a silicon-on-insulator material layer, a germanium material layer, and an insulating dielectric layer (such as silicon oxide Layer) etc. are used to open trenches therein and form a conductor filling structure as a metal connection line. Of course, the substrate 200 can also be any semiconductor stacked structure, and it is necessary to open a cavity therein for preparing a conductor filling structure to realize The role of conducti...

Embodiment 2

[0158] Such as Figure 5 As shown, the present invention also provides a method for preparing a capacitor structure array, wherein the preparation of the capacitor structure array in the second embodiment includes the preparation of the conductor structure based on the polysilicon process in the first embodiment, including steps:

[0159] 1) A semiconductor substrate is provided, the semiconductor substrate includes a plurality of capacitive contact nodes located in the memory array structure, and alternately stacked sacrificial layers and supporting layers are formed on the semiconductor substrate;

[0160] 2) forming a patterned mask layer with windows arranged in an array on the structure obtained in step 1), and etching the sacrificial layer and the supporting layer based on the patterned mask layer to form a a capacitive hole corresponding to the window, the capacitive hole exposing the capacitive contact node;

[0161] 3) forming a lower electrode layer on the bottom an...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
thicknessaaaaaaaaaa
particle sizeaaaaaaaaaa
particle sizeaaaaaaaaaa
Login to view more

Abstract

The present invention provides a polysilicon-based conductor structure, capacitor array structure and preparation method. The conductor structure preparation includes: providing a base, forming a cavity structure in the base; forming a conductor filling structure in the cavity structure, forming a conductor filling structure The material source at least includes a silicon source and a germanium source, and the germanium atoms in the germanium source serve as crystal nuclei for the silicon atoms in the silicon source to gather and grow, so as to increase the silicon crystal grain size in the conductor filling structure. Through the above scheme, the present invention proposes a method of manufacturing large-grain polysilicon, and introduces crystal nuclei elements, such as germanium, as silicon grains to gather and grow, so that silicon atoms gather and then increase the crystal grain size, and increasing the polycrystalline silicon crystal grain size can reduce the grain boundary The influence of traps on carriers increases the conductivity. The invention also prevents the influence of germanium in the conductor filling structure on the process through the setting of the protective layer, and achieves the effective connection between the conductor filling structure and other structural layers, further improving the Electrical properties of conductor-filled structures.

Description

technical field [0001] The invention belongs to the field of semiconductor devices and manufacturing, and in particular relates to a conductor structure based on a polysilicon process, a capacitor array structure and a preparation method. Background technique [0002] Dynamic Random Access Memory (DRAM for short) is a semiconductor storage device commonly used in computers, and is composed of many repeated storage units. Each memory cell usually includes a capacitor and a transistor; the gate of the transistor is connected to the word line, the drain is connected to the bit line, and the source is connected to the capacitor; the voltage signal on the word line can control the opening or closing of the transistor, and then through the bit line Read the data information stored in the capacitor, or write the data information into the capacitor through the bit line for storage. At present, in the DRAM process below 20nm, the DRAM adopts a stacked capacitor structure, and its ca...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/8242H01L27/108
CPCH10B12/37H10B12/03
Inventor 不公告发明人
Owner CHANGXIN MEMORY TECH INC
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products