Modeling and packaging method for process tolerance and electric performance coupling characteristics in radio frequency integration

Abstract

The invention provides a modeling and packaging method for process tolerance and electric performance coupling characteristics in radio frequency integration. The method starts from development and application of process IP models to put forward an integrated scheme which is compatible with existing modeling algorithms and rapidly and correctly realizes model development, integrated packaging andupdating maintenance by utilizing data of electromagnetic simulation combined test, and the integrated scheme is particularly suitable for modeling and simulation of process tolerance and electric performance coupling characteristics in radio frequency microwave integration. According to the method, processing and modeling are carried out on process tolerance data in integrated manufacturing, andmanufacture process levels are truly fed back to designers for calling through a standard IP library form, so that system-level simulation can cover analysis of process tolerance, the simulation is capable of rapidly and effectively verifying influences, on system performance, of the process manufacturing levels, and benefit is brought to shorten the design verification period.

Description

technical field [0001] The invention belongs to the technical field of radio frequency microwave modeling and simulation, and in particular relates to a modeling and packaging method of radio frequency integration process tolerance and electrical performance coupling characteristics. Background technique [0002] As the main link in the integrated manufacturing of RF and microwave systems, RF and microwave integration processes, such as gold wire bonding, vertical interconnection, and horizontal transition structures commonly used in typical components or device packaging, are important for ensuring the electrical performance of RF and microwave systems, especially RF signal transmission. very important role. [0003] The representative existing radio frequency modeling methods are mainly methods based on neural network modeling combined with vector fitting modeling and empirical models. The core of such methods is to adapt prior knowledge base functions for different model...

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Problems solved by technology

At present, the process fluctuation tolerance range in this field is relatively large. If the influence of process tolerance in the system integration process is ignored in the simulation design, there will often be a large difference between the expected performance of the product and the final performance.

Due to the complex relationship between the electrical properties of RF transmission structures and integrated process parameters, there is currently a lack of a method that can quickly and effectively model process tolerances, and there are differences in process levels among manufacturers, so it is difficult to provide standard A general-purpose process IP model that can reflect the manufacturing level, and the need for rapid response in the development of RF and microwave products also makes the role of process IP gradually prominent

[0006] In addition, the radio frequency transmission structure is developing rapidly and has a wide variety, and the model structure and modeling methods involved also need to be researched and expanded. The existing methods are not effectively applicable to the modeling of process tolerance electrical properties, and there are the following problems in actual research and application:

[0007] 1) The application range of the modeling algorithm is limited, and the applicability is not strong. It is mainly aimed at modeling RF components with specific structures and parameters, and cannot meet the process tolerance modeling requirements of practical applications. A suitable engineering application is urgently needed. Process IP modeling algorithm;

[0008] 2) The method provided by EDA simulation software cannot truly, quickly and effectively analyze the influence of process tolerances on the performance of RF and microwave systems during the integration process in system-level modeling and simulation;

[0009] 3) For the integrated manufacturing process, it cannot provide a standard scalable process IP modeling and database construction method that can quantitatively reflect the fluctuation level of its own process parameters

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