Film magnetism measuring method

Abstract

The invention relates to a film magnetism measuring method, and relates to the technical field of measurement. A measuring device comprises a laser, a delayer, a 1 / 4 wave plate, a concave lens, a first convex lens, a flat mirror, a Polaroid, a beam splitter, a second convex lens, a lens bench, an atomic force microscope, a probe, a lens mount, an object lens, a sample, a waveguide, a sample bench,a signal generator, an oscilloscope, a detector, an antenna, a lock-in amplifier, a computer and a phase sensitive detector. A high-precision positioning device guides a laser beam to a mini antennaposition in the sample surface, a localized light near field is generated near the surface of a metal sample in the antenna position, a magneto-optical Kerr signal of a nanostructure is obtained in the sample surface and enhanced, the sensitivity is high, less laser entering a through hole of the probe via the atomic force microscope is reflected back to the atomic force microscope directly, diffuse reflection light radiated to the sample surface is reduced, influence on effective reflection signal detection is reduced, and the signal to noise ratio is improved.

Description

technical field [0001] The invention relates to the technical field of physical measurement, in particular to a thin-film magnetic measurement method capable of obtaining strong magneto-optical Kerr signals. Background technique [0002] The magneto-optical Kerr effect measurement device is an important means in the study of material surface magnetism. Its working principle is based on the magneto-optic Kerr effect caused by the interaction between light and magnetized media. Magnetic detection, and non-contact measurement can be realized, and it has important applications in the research of magnetic order, magnetic anisotropy, interlayer coupling and phase transition behavior of magnetic ultrathin films. The magneto-optical Kerr effect measurement device mainly detects the magnetization observation of the sample surface by detecting the change of the polarization state of a beam of linearly polarized light after it is reflected on the surface of the material. Therefore, the...

AI Technical Summary

Problems solved by technology

The magneto-optical Kerr effect measurement device mainly detects the magnetization observation of the sample surface by detecting the change of the polarization state of a beam of linearly polarized light after it is reflected on the surface of the material. Therefore, the imaging effect is easily limited by the optical elements. Technical defect 1: the spatial resolution of the traditional focusing Kerr microscope using microscope objective lens is determined by the optical diffraction limit, so it is impossible to obtain the dynamic characteristics of magnetization at the nanometer scale; existing technical defect 2: the magneto-optical Kerr effect in the near field The intensity of the reflected light signal obtained by the measurement is low, resulting in a low signal-to-noise ratio of the magneto-optical Kerr signal, and the thin-film magnetic measurement method can solve the problem

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