Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A Stress Sensor Based on Mach-Zehnder Interference Structure

A technology of stress sensor and interference structure, which is applied in the direction of measuring the change force of optical properties of materials when they are stressed, can solve the problems of variable frequency, difficult to filter out, unfavorable optical fiber sensors, etc., and achieve reliable work , The effect of small phase detection error

Inactive Publication Date: 2020-03-27
JILIN UNIV
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, on the one hand, the high-frequency component itself will affect the phase detection of the cosine wave (the position of the zero-crossing point changes); The electrical characteristics are equivalent to capacitance, and the voltage at both ends cannot jump, so the falling edge of the sawtooth wave cannot be infinitely short) and the elasticity of the optical fiber itself and many other factors, the frequency is variable, and it is difficult to filter out cleanly; and , when using a filter, in addition to affecting the amplitude-frequency characteristics of the output signal, it will also affect the phase-frequency characteristics of the signal at the same time, that is, the phase of the filter will be affected near the cut-off frequency, which is very important for relying on phase changes. It is very disadvantageous for fiber optic sensors that measure changes in stress

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A Stress Sensor Based on Mach-Zehnder Interference Structure
  • A Stress Sensor Based on Mach-Zehnder Interference Structure
  • A Stress Sensor Based on Mach-Zehnder Interference Structure

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0028] Example 1 Overall structure of the present invention

[0029] Such as figure 1 As shown, the overall structure of the present invention has a pump source 1 (980nm laser, maximum output power of 1W) and a first optical coupler 2 (produced by OZ-OPTICS company, model FUSED-12-1064-7 / 125- 90 / 10-3U-3mm, the splitting ratio is 90:10) the input end is connected, the 90% output end of the first optical coupler 2 is connected to the 980nm of the optical wavelength division multiplexer 3 (980 / 1550nm wavelength division multiplexer) The 1550nm end of the optical wavelength division multiplexer 3 is connected to one end of the optical fiber wound on the first piezoelectric ceramic 12 (cylindrical piezoelectric ceramic, outer diameter 50mm, inner diameter 40mm, height 50mm), and is wound on the first pressure The other end of the optical fiber on the electroceramic 12 is connected to the input end of the first optical isolator 11 (1550nm polarization-independent optical isolator), and...

Embodiment 2

[0031] Example 2 Function Conversion Circuit

[0032] Such as figure 2 As shown, the structure of the function conversion circuit 29 used in the present invention is that one end of the capacitor C3 is connected to the pin 12 of the trigonometric function converter U1 (AD639) and one end of the resistor R2, and the other end of the capacitor C3 is used as the function conversion circuit 29. The input terminal of, denoted as port ACOS_in, is connected to the output terminal of the second photoelectric conversion circuit 28; the other end of the resistor R2 is grounded; the pins 2, 3, 4, 5, 8, 11, and 13 of the trigonometric function converter U1 are grounded , The pins 9 and 10 are connected to one end of the capacitor C2 and the -12V power supply, and the other end of the capacitor C2 is grounded; the pin 6 of the trigonometric function converter U1 is connected to the pin 7, and the pin 16 is connected to the +12V power supply and the capacitor C1 One end is connected, the othe...

Embodiment 3

[0033] Embodiment 3 Adaptive amplitude normalization circuit

[0034] Since the amplitude of the signal output by the function conversion circuit 29 is small and is affected by multiple parameters in the optical path and the circuit, the magnitude is uncertain. Therefore, the present invention designs an adaptive amplitude normalization circuit 30 to convert the signal output by the function conversion circuit 29 The amplitude of is normalized to the optimal size to further improve the accuracy of demodulation. The specific structure is that one end of the capacitor C11 is connected to one end of the resistor R21 and the pin 3 of the chip U2, the other end of the resistor 21 is grounded, and the other end of the capacitor C11 is used as the input end of the adaptive amplitude normalization circuit 30, denoted as port ADAPT_in , Connected to port ACOS_out of function conversion circuit 29; pin 1, pin 7, pin 8, and pin 14 of chip U2 are all grounded, pin 2 and pin 4 are both connec...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
wavelengthaaaaaaaaaa
reflectanceaaaaaaaaaa
Login to View More

Abstract

The invention discloses a stress sensor based on a Mach-Zehnder interference structure, and belongs to the technical field of optical fiber sensors. The main structure of the stress sensor comprises apumping source (1), a first optical coupler (2), an optical wavelength division multiplexer (3) and the like. By use of the stress sensor, a sinusoidal signal is taken as a modulation signal, no high-frequency interference is generated, and the stress sensor has the characteristics of being reliable in working, high in sensing accuracy, wide in application range and the like.

Description

Technical field [0001] The invention belongs to the technical field of optical fiber sensors, and particularly relates to a stress sensor based on a Mach-Zedel interference structure. Background technique [0002] Fiber Bragg grating (FBG) is widely used in the field of sensing technology because of its advantages such as anti-electromagnetic interference, chemical resistance, low transmission loss, small size and light weight, and easy mass production. At present, stress sensors have a wide range of applications in the field of engineering technology. Especially in emerging fields such as nanoparticle interaction and cell mechanics, there is an urgent need for micro-stress sensors. The safety monitoring of bridges, tunnels and building structures is inseparable from micro-stress sensors. However, due to the above-mentioned advantages of fiber Bragg grating, the stress sensor composed of it has higher reliability than other sensors, and is more suitable for use under harsh condi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01L1/24
CPCG01L1/24
Inventor 高博张栋林旻邱天
Owner JILIN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com