Millimeter wave amplifier chip testing cavity and method

Abstract

The invention discloses a millimeter wave amplifier chip testing cavity and method. Existing coaxial-interface-based millimeter wave amplifier chip testing devices only reaches a maximum working frequency of 145 GHz and fails to meet the testing and modularizing demands of high-frequency millimeter wave amplifier chips and to be applied to a millimeter wave front-end system. The millimeter wave amplifier chip testing cavity comprises an input interface cavity, an input end microstrip probe matching structure loading cavity, a millimeter wave amplifier chip loading cavity, an output end microstrip probe matching structure loading cavity, an output interface cavity, a first capacitor combination cavity and a second capacitor combination cavity, wherein the first capacitor combination cavityand the second capacitor combination cavity are arranged o both sides of the millimeter wave amplifier chip testing cavity. According to the millimeter wave amplifier chip testing cavity, the bias voltage of a millimeter frequency amplifier chip can be applied to independent power supply or by-pass capacitor filtering, thereby simplifying the structure and improving the circuit stability.

Description

technical field [0001] The invention belongs to the technical field of test cavity structure in microwave and millimeter wave chip circuits, and in particular relates to a test cavity for realizing a millimeter wave amplifier chip based on computer-aided metal cavity processing technology. Background technique [0002] In recent years, with the rapid development of wireless communication technology and the widespread use of various wireless terminals, high-speed wireless communication technology has put forward higher requirements for larger bandwidth and spectrum resources. The millimeter-wave frequency band has attracted widespread attention because of its wide bandwidth, large capacity, and easy miniaturization of the realized system. It has broad application prospects in the fifth and next generation wireless communications. The development of millimeter wave wireless communication technology is particularly important under the trend that the frequency utilization rate o...

AI Technical Summary

Problems solved by technology

However, the millimeter-wave amplifier chip test device in the form of a coaxial interface can only work at a frequency up to 145GHz (0.8mm interface), which cannot meet the requirements of high-band millimeter-wave amplifier chip testing, module implementation, and use in millimeter-wave front-end systems.

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