Split-gate flash memory and preparation method thereof
A memory and flash memory technology, which is applied in the field of split-gate flash memory and its preparation, can solve problems such as stripping, polysilicon residue, and poor memory function, and achieve the effects of improving yield, increasing area utilization, and increasing production efficiency
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[0032] As mentioned in the background art, when the logic transistor gate is formed on the logic region of the semiconductor substrate, polysilicon residues tend to appear at the boundary of the storage region. Specifically, when forming the gate of the logic transistor in the logic area: first, it is necessary to form a polysilicon layer, an oxide layer, and a photoresist on the semiconductor substrate of the logic area and the storage area, wherein the storage area includes A word line gate and a protective layer wrapping the word line gate, the oxide layer is used to prevent the residue of photoresist on the surface of the polysilicon layer in the subsequent photolithography process; then, the photoresist is patterned to Forming an opening at a position other than the gate area of the logic transistor, that is, patterning the photoresist to have an opening in the storage area; and then performing anisotropic etching on the polysilicon layer and the oxide layer at the openi...
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