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Method for measuring coverage rate of quantum dot surface ligand

A technology of surface ligand and measurement method, applied in the field of quantum dots, can solve the problems of affecting the light-emitting layer film, poor solubility, low pixel resolution, etc., and achieve the effect of improving pixel resolution, ensuring stability, and ensuring solubility.

Active Publication Date: 2019-06-25
TCL CORPORATION
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

If the surface coverage of the quantum dots is low, the solubility of the quantum dots is poor, the uniformity of the quantum dot solution is poor, and the drying rate of the quantum dot solution and the coffee ring effect affect the quality of the light-emitting layer film, which directly leads to the quality of the printed panel. Problems such as unevenness, low pixel resolution, turn-on voltage, uneven photoelectric efficiency, etc.

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0058] A method for measuring the coverage of ligands on the surface of quantum dots, comprising:

[0059](1) Determine the average particle size d, and provide several sample particles, which include CdTe quantum dots and 1,2-ethanedithiol ligands bound on the surface of the CdTe quantum dots. Dissolve the sample particles in the heptane solution to prepare a 5 mg / mL solution. After the solution is completely dissolved, take a small amount of the sample particle solution and drop 5 drops on the copper grid, and place the copper grid in a transmission electron microscope analyzer for testing and analysis. Set the accelerating voltage to 200 kV, the emission current to 10 μA, the working distance to 15 mm, and the dead time to 20%. For magnification analysis of the sample particles, first set the magnification to 70,000 times, take the area where the sample particles are concentrated and uniformly dispersed for focusing analysis, and take its TEM pictures. To analyze the TEM i...

Embodiment 2

[0067] A method for measuring the ligand coverage of quantum dots, comprising:

[0068] (1) Determine the average particle size d, and provide several sample particles, which include ZnO quantum dots and n-propylamine bound to the surface of the ZnO quantum dots. Dissolve the sample particles in the heptane solution to prepare a 5 mg / mL solution. After the solution is completely dissolved, take a small amount of the sample particle solution and drop 5 drops on the copper grid, and place the copper grid in a transmission electron microscope analyzer for testing and analysis . Set the accelerating voltage to 300 kV, the emission current to 15 μA, the working distance to 18 mm, and the dead time to 25%. For magnification analysis of the sample, first set the magnification to 110,000 times, take the area where the sample particles are concentrated and uniformly dispersed for focusing analysis, and take its TEM picture. To analyze the TEM images, first set the scale length, and t...

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PUM

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Abstract

The invention provides a method for measuring the coverage rate of a quantum dot surface ligand. The coverage rate Ki of the organic ligand containing sulfydryl or nitrogen on the quantum dot surfaceis determined by potentiometric titration. The method can be used for quality evaluation of the quantum dot. If the Ki is less than 2*10<-10> mol / cm<2>, the quality of the quantum dot is poor; and solution or ink configuration can not be carried out until the Ki value is improved. With the provided method, the result is accurate; and the operation is simple. Furthermore, with the method, the highstability of the quantum dot surface ligand content is ensured; the solubility of different batches of quantum dots is guaranteed; a coffee ring effect caused by different drying rates in quantum dotsolution preparation for a film is avoided; add the pixel resolution and uniformity of the brightening voltage and the photoelectric efficiency of the quantum dot display panel can be improved.

Description

technical field [0001] The invention relates to the technical field of quantum dots, in particular to a method for measuring ligand coverage on the surface of quantum dots. Background technique [0002] Quantum dots refer to semiconductor nanocrystals whose geometric size is smaller than their excitonic Bohr radius. Quantum dots have great potential applications in the fields of biomedicine, environmental energy, and lighting display due to their excellent optical properties such as absorption bandwidth, narrow fluorescence emission band, high quantum efficiency, and good photostability. The display technology based on quantum dot luminescence has been highly valued by the display industry in recent years. Compared with liquid crystal display and organic light-emitting display, quantum dot luminescence has a wider color gamut, higher color purity, simpler structure, and higher stability. It is considered It is a new generation display technology. [0003] The preparation t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N31/16
CPCY02E10/549
Inventor 叶炜浩覃辉军杨一行
Owner TCL CORPORATION
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