Method for measuring coverage rate of quantum dot surface ligand
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- TCL CORPORATION
- Publication Date
- 2019-06-25
Abstract
Description
technical field
[0001] The invention relates to the technical field of quantum dots, in particular to a method for measuring ligand coverage on the surface of quantum dots. Background technique
[0002] Quantum dots refer to semiconductor nanocrystals whose geometric size is smaller than their excitonic Bohr radius. Quantum dots have great potential applications in the fields of biomedicine, environmental energy, and lighting display due to their excellent optical properties such as absorption bandwidth, narrow fluorescence emission band, high quantum efficiency, and good photostability. The display technology based on quantum dot luminescence has been highly valued by the display industry in recent years. Compared with liquid crystal display and organic light-emitting display, quantum dot luminescence has a wider color gamut, higher color purity, simpler structure, and higher stability. It is considered It is a new generation display technology.
[0003] The preparation t...