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A device for correcting the distortion of the accelerating electric field of a time-of-flight mass spectrometer

A time-of-flight mass spectrometry and accelerating electric field technology, applied in the electromagnetic field, can solve the problems that ions cannot reach the detector and the speed is high, and achieve the effect of simple device structure, low cost and reduced cost

Active Publication Date: 2020-07-10
TSINGHUA UNIV
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  • Abstract
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  • Application Information

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Problems solved by technology

However, this method is not applicable in the case of a high-voltage single accelerating electric field. The polarization of the sample plate will cause the velocity in the direction perpendicular to the electric field to be too large, so that the ions cannot reach the detector.

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  • A device for correcting the distortion of the accelerating electric field of a time-of-flight mass spectrometer
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  • A device for correcting the distortion of the accelerating electric field of a time-of-flight mass spectrometer

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Embodiment Construction

[0020] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the drawings in the embodiments of the present invention.

[0021] A device for correcting the distortion of the accelerating electric field of a time-of-flight mass spectrometer according to an embodiment of the present invention, see figure 1 , the device bears the role of carrying samples and accelerating ions in the time-of-flight mass spectrometer, and is a part of the ion source. This device specifically comprises upper and lower two accelerating electrodes 1, 2, a sample plate 3 positioned between the two accelerating electrodes and placed parallel to the accelerating electric field, at least one of the upper and lower surfaces of the sample plate 3 is coated with a metal film ( The metal film is arranged parallel to the direction of the accelerating electrode, such as figure 1 4 and 5 in ), provide different voltages to the pl...

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Abstract

The invention provides a device for correcting the acceleration electric field distortion of a time-of-flight mass spectrometer; the device comprises an upper acceleration electrode, a lower acceleration electrode, and a sample plate positioned between the two acceleration electrodes and parallel to the acceleration electric field, wherein a metal film is plated on at least one of the upper surface and the lower surface of the sample plate, and different voltages are applied to the plated metal film and the upper and lower acceleration electrodes; when the metal film is plated on one side only, the voltage applied to the metal film is the voltage corresponding to the maximum mass spectrum signal of a sample to be detected; when the metal film is plated on both sides, the net distance between the two accelerating electrodes is to be x, the voltage of the upper accelerating electrode and the voltage of the lower accelerating electrode are U1 and U2 respectively, and the voltage of the plated metal film on the sample plate is d (U1- U2) / x + U2, and d represents the net distance between the corresponding metal film and the lower acceleration electrode. The device is simple in structure, and can ensure that the uniform acceleration electric field formed by the mass spectrometer acceleration electrode is hardly influenced by the sample plate, so that the flying trajectory of ions isnot influenced by a distorted electric field.

Description

technical field [0001] The invention belongs to the field of electromagnetic technology, and in particular relates to a device for correcting the acceleration electric field distortion of a time-of-flight mass spectrometer. Background technique [0002] Mass spectrometry imaging is widely used in materials science, pharmacy, biology and other fields. It can simultaneously provide information on the composition and spatial distribution of molecules in substances. Especially in the analysis and research of biological tissues and cells, it is of great significance to provide the required chemical composition structure information. [0003] Laser desorption / ionization mass spectrometry is a commonly used mass spectrometry imaging technique. Generally, the sample is placed on a metal surface or a glass sheet coated with a conductive layer, and the analytical laser is irradiated on the sample surface at a certain angle (such as 45°). When the laser intensity is strong enough, ion...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01J49/06H01J49/40
CPCH01J49/062H01J49/40
Inventor 莫宇翔梁奎刘峰
Owner TSINGHUA UNIV