The invention provides an SF6 /
epoxy core interface fluorinated layer charge accumulation-dissipation regulation and control method and characterization
system, a nanoscale fluorinated layer is constructed on the surface of
epoxy resin through gradient
gas phase fluorination, and the proportion of C-F bonds of the
epoxy resin fluorinated layer is controlled to be 68% + / -2% through XPS in-situ characterization real-time optimization. The charge behavior and trap
state distribution of the SF6 / epoxy interface are regulated and controlled, the interface breakdown
field strength is improved, and the real-time monitoring of the trap
state density and the dynamic charge distribution is realized by integrating an XPS probe and a surface
potentiometer in combination with a characterization
system. Through a cross-scale technical path of molecular scale fluorination site regulation and control-
nanostructure morphology control-macroscopic performance real-time
verification, accurate regulation and control of epoxy resin fluorination
layer interface charges and trap
state density are realized, the problems that the trap
state density of a traditional fluorination layer is relatively high, and carrier accumulation and
electric field distortion are easily caused are solved, and the performance of the epoxy resin fluorination layer is improved. Therefore, the insulating performance is improved, and the method is suitable for performance optimization of epoxy insulating parts in SF6 gas insulated
electrical equipment.