Active device and passive monocrystal device in radio frequency front-end module and monolithic integration method
An active device, RF front-end technology, used in semiconductor/solid-state device components, electrical solid-state devices, semiconductor devices, etc., can solve problems such as increasing assembly complexity and electrical connection loss, reducing assembly complexity and reducing volume. Effect
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Embodiment 1
[0068] This embodiment provides a monolithic integration method of active devices and passive single crystal devices in a radio frequency front-end module, including the following steps:
[0069] (1) The first substrate 103 is selected as the epitaxial growth substrate, and the first single crystal layer 104, the second single crystal layer 105 and the third single crystal layer 106 are sequentially grown on the epitaxial growth substrate from bottom to top, such as figure 2 shown;
[0070] (2) Perform selective etching on the upper surface of the third single crystal layer 106, etch from top to bottom to the second single crystal layer 105, exposing part of the upper surface of the first single crystal layer 104, such as image 3 Shown; Bottom electrode 107 is prepared on the exposed part of the first single crystal layer 104 upper surface, as Figure 4 shown;
[0071] (3) Prepare the source electrode 108 on the upper surface of the third single crystal layer 106 close to ...
Embodiment 2
[0090] This embodiment provides a monolithic integration method of active devices and passive single crystal devices in a radio frequency front-end module, including the following steps:
[0091] (1) The first substrate 103 is selected as the epitaxial growth substrate, and the first single crystal layer 104, the second single crystal layer 105 and the third single crystal layer 106 are sequentially grown on the epitaxial growth substrate from bottom to top, such as figure 2 shown;
[0092] (2) Perform selective etching on the upper surface of the third single crystal layer 106, etch from top to bottom to the second single crystal layer 105, exposing part of the upper surface of the first single crystal layer 104, such as image 3 Shown; Bottom electrode 107 is prepared on the exposed part of the first monocrystalline layer 104 upper surface, as Figure 4 shown;
[0093] (3) Prepare a Bragg reflection layer on the upper surface of the bottom electrode 107. The Bragg reflect...
Embodiment 3
[0114] This embodiment provides a monolithic integration method of active devices and passive single crystal devices in a radio frequency front-end module, including the following steps:
[0115] (1) The first substrate 103 is selected as the epitaxial growth substrate, and the first single crystal layer 104, the second single crystal layer 105 and the third single crystal layer 106 are sequentially grown on the epitaxial growth substrate from bottom to top, such as figure 2 shown;
[0116] (2) Perform selective etching on the upper surface of the third single crystal layer 106, etch from top to bottom to the second single crystal layer 105, and form a second void in the second single crystal layer 105 and the third single crystal layer 106. cavity 123, exposing part of the upper surface of the first single crystal layer 104, such as Figure 20 As shown, the bottom electrode 107 is prepared on the exposed part of the upper surface of the first single crystal layer 104, as ...
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Abstract
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