A multi-probe star sensor on-orbit autonomous fault diagnosis and repair method

Abstract

The invention relates to an on-orbit autonomous fault diagnosis and repair method of a multi-probe star sensor, belonging to the technical field of satellite attitude control. The multi-probe star sensor performs information fusion processing based on the star point information in the field of view of multiple probes to further improve product accuracy. After multiple probes are fused, the index is better than 0.6″ (3σ), and the index for a single probe is better than 1. ″(3σ), its technical characteristics are very high precision, high dynamic and high dynamic performance, and it is mainly used in remote sensing satellites and high-resolution earth observation satellites; Software-based independent fault diagnosis and repair method; at the same time, for the single-point problem of power supply and distribution in the product hardware design, the fault tolerance of the single machine and the system is improved; at the same time, it can perform real-time diagnosis and processing of multiple different faults of the product on orbit, effectively improving the The reliability of star sensor products.

Description

technical field [0001] The invention relates to an on-orbit autonomous fault diagnosis and repair method of a multi-probe star sensor, belonging to the technical field of satellite attitude control. Background technique [0002] The star sensor is an attitude measurement sensor with the highest measurement accuracy in aerospace applications. It uses the precisely positioned stars in the celestial sphere as an absolute reference system, and determines the attitude of the aircraft by detecting stars in different positions on the celestial sphere. The three-axis pose of the coordinate system. With the advantages of high precision, no drift and high reliability, it is a key component of satellite attitude measurement. [0003] The star sensor is a complex system composed of optical, mechanical and electrical components. Its working environment is special, and it must have high reliability and safety for long-term operation. It is inevitable for the star sensor system to fail d...

AI Technical Summary

Problems solved by technology

[0014] Second, imaging detector failure

[0017] Third, memory failure

[0018] On the one hand, the failure of the memory is due to the dense array of internal cells in the memory, and there may be data disturbance between each other, including the mutual influence of data between rows, columns and cells; on the other hand, during the satellite flight, the star sensor signal processing The interior of the circuit, such as static random access memory, is sensitive to space radiation, and is prone to single event phenomenon, causing bit flips in instruction registers, stack pointer registers, interrupt vector tables and connection pointers, etc., resulting in disordered operation of product software

Since the operation code and operation data of the computer program are stored in the memory, depending on the location of the fault, two results may occur in the operation of the product program: one is to change the operation code, causing the program to run away or perform wrong operations; The second is to change the number of operands, resulting in wrong operation results

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