Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Contact plug, semiconductor device and manufacturing method thereof

A contact plug and manufacturing method technology, which is applied in the fields of semiconductor/solid-state device manufacturing, semiconductor devices, semiconductor/solid-state device parts, etc. The effect of reducing contact resistance

Active Publication Date: 2019-12-13
SEMICON MFG INT (SHANGHAI) CORP +1
View PDF14 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, with the increasing integration of integrated circuits, the contact plugs formed by the current contact plug manufacturing methods cannot meet the manufacturing requirements of higher-performance FinFET devices.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Contact plug, semiconductor device and manufacturing method thereof
  • Contact plug, semiconductor device and manufacturing method thereof
  • Contact plug, semiconductor device and manufacturing method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0045] A method of manufacturing a contact plug, comprising the steps of:

[0046] First, please refer to Figure 1A , 1B and Figure 2A , providing a semiconductor substrate 100, on which a gate structure 101 (which may be a polysilicon gate structure or a high-K metal gate structure) is formed on the semiconductor substrate 100, and the top of the gate structure 101 is covered with A silicon nitride mask layer 102, sidewalls 103 are formed on the sidewalls of the gate structure 102 and the silicon nitride mask layer 102, and fins 100a are formed in the semiconductor substrate 100 (which may be formed by embedded source-drain epitaxy source or drain region formed by the process);

[0047] Then, please continue to refer to Figure 1A , 1B and Figure 2A , depositing a sufficiently thick interlayer dielectric layer 104 on the surfaces of the semiconductor substrate 100, sidewalls 103, and silicon nitride mask layer 102, and planarizing the top of the interlayer dielectric...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a contact plug, a semiconductor device and a manufacturing method thereof to realize the manufacture of an alternative contact plug. A virtual contact only covering above a to-be-contacted region of a to-be-contacted structure can be removed with the assistance of a filling layer, in order to form a contact trench at the position of the virtual contact. A dielectric spacer is formed on the sidewall of the contact trench, and then a conductive material layer fills the space of the contact trench surrounded by the dielectric spacer to form the contact plug. This alternative process can reduce the difficulty in forming the contact plug, improve the quality of the formed contact plug, and increase the contact area of the formed contact plug by reducing the thickness of the dielectric spacer, reduce contact resistance, is applicable to the manufacture of the contact plug on a to-be-contacted structures such as gates, source-drain regions, and body regions, and can improve the performance of corresponding contact plugs and semiconductor devices.

Description

technical field [0001] The invention relates to the technical field of integrated circuit manufacturing, in particular to a contact plug, a semiconductor device and a manufacturing method thereof. Background technique [0002] MOSFET (Metal Oxide Semiconductor Field Effect Transistor) is the main building block of most semiconductor devices. As the size of semiconductor devices becomes smaller and smaller (scaling continues below the 14nm node), the distance between the drain and the source is also shortened. The short-channel effect becomes more and more obvious, the control ability of the gate to the channel becomes worse, and it becomes more and more difficult for the gate voltage to pinch off the channel, and it is more likely to cause subthrehhold leakage (Subthrehhold leakage). In order to suppress the short channel effect, it is proposed to form a Fin Field Effect Transistor (Fin Field effect transistor, FinFET) on an SOI wafer or a bulk semiconductor substrate. The ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/768H01L23/535H01L29/78
CPCH01L21/76895H01L23/535H01L29/785H01L2029/7858
Inventor 张海洋刘少雄钟伯琛
Owner SEMICON MFG INT (SHANGHAI) CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products