Dual-wavelength common-path phase microscopic imaging measurement system based on F-P interferometer

A phase microscopy and imaging measurement technology, applied in the field of optical imaging, can solve the problems of defocusing information reducing image contrast, complexity, and small scope of application, and achieve the goal of reducing phase speckle noise, improving resolution, and improving accuracy and stability. Effect

Inactive Publication Date: 2020-05-08
GUILIN UNIV OF ELECTRONIC TECH
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  • Application Information

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Problems solved by technology

[0005] Ordinary optical microscopy using bright field illumination usually has three limitations: first, it can only image dark samples (transmission type) or strongly reflective samples (reflection type); second, the optical diffraction limit limits The highest resolution of this technology is about 200nm; the third is that the defocus information will reduce the image contrast
It can perform high-precision detection on different types of cell samples, but the system is based on the principle of cell fluorescence imaging, and cannot image other non-cellular particles and objects, so the scope of application is limited
[0010] Patent CN201710904860.1 discloses an optical coherence tomography imaging system, which uses Mach-Zehnder interference optical path, which is characterized by the use of optical fibers to simplify the system and reduce costs, but compared with the optical path structure of the F-P cavity, it is still relatively complex

Method used

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  • Dual-wavelength common-path phase microscopic imaging measurement system based on F-P interferometer
  • Dual-wavelength common-path phase microscopic imaging measurement system based on F-P interferometer
  • Dual-wavelength common-path phase microscopic imaging measurement system based on F-P interferometer

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Embodiment Construction

[0047] The present invention will be further described below in conjunction with specific examples. But it should not limit the protection scope of the present invention.

[0048] Please see first figure 1 , figure 1 It is a dual-wavelength co-channel phase microscopic imaging measurement system based on F-P interferometer of the present invention. Its characteristics are: it consists of laser light source 1, light attenuation sheet 2, LFC fiber coupler 3, single-mode fiber 4, FCL fiber collimator 5, beam expander 6, F-P interferometer 7, object to be measured 8, microscope Objective lens 9, CCD detection camera 10 and computer 11 are made up.

[0049] The positional relationship of the above originals is as follows:

[0050] First refer to the light source 1-1, along the optical axis direction of the output light of the laser light source 1-1, followed by the attenuation sheet 2-1, the LFC fiber coupler 3-1, and then the single-mode fiber 4- 1 Connect the fiber coupler...

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Abstract

The invention provides an intracavity enhanced dual-wavelength common-path phase microscopic imaging measurement system based on an F-P interferometer. The system is characterized by being composed ofa laser light source 1, an optical attenuation sheet 2, an optical fiber coupler (LFC) 3, a single-mode optical fiber 4, an optical fiber collimator (FCL) 5, a beam expander 6, an F-P interferometer7, a to-be-measured object 8, a microscope objective 9, a CCD detection camera 10 and a computer 11. The system can be used for digital holography and refractive index measurement of tiny objects, andcan be widely applied to the field of refractive index three-dimensional microscopic imaging of various tiny objects.

Description

[0001] (1) Technical field [0002] The invention relates to a dual-wavelength co-channel phase microscopic imaging measurement system based on an F-P interferometer, which can be used for three-dimensional microscopic imaging of the refractive index inside cells and various tiny objects, and belongs to the technical field of optical imaging. [0003] (2) Background technology [0004] Micro-optical imaging, also commonly referred to as "Optical Microscopy" (Optical Microscopy or "Light Microscopy"), refers to the visible light transmitted through a sample or reflected from a sample, after passing through one or more lenses, A technology that can obtain magnified images of tiny samples. The resulting images can be directly observed with the eyes through the eyepiece, or can be recorded with a photosensitive plate or a digital image detector such as a charge-coupled device (CCD) or a complementary metal-oxide semiconductor (CMOS). It can be displayed and analyzed on a computer. ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/45G03H1/00G03H1/04G03H1/22
CPCG01N21/453G03H1/0005G03H1/0443G03H1/22G01N2021/4173G03H2001/0038G03H2001/005
Inventor 苑立波李晟孟令知
Owner GUILIN UNIV OF ELECTRONIC TECH
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