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Diffusion welding method of copper target material and back plate

A technology of diffusion welding and back plate, which is applied in the welding of target components and the diffusion welding of copper target and back plate, which can solve the problems of porosity, weld seam and coarse grains on the edge of copper target , poor welding effect and other problems, to avoid abnormal grain growth, good thermal conductivity, and ensure the effect of bonding

Active Publication Date: 2020-05-12
KONFOONG MATERIALS INTERNATIONAL CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although the welding method evenly arranges the metal powder to fill the holes caused by the thread extrusion deformation, thereby improving the bonding rate of the high-purity copper target and the back plate, there is still a problem of abnormal grain growth during the welding process. Problems, especially coarse grains tend to appear at the edge of the copper target
[0009] Although the welding methods in the above prior art all adopt the HIP diffusion welding technology, the welding effect is still not good, and pores and weld seams are prone to appear at the edge of the copper target during the welding process, resulting in the presence of grains during the welding process. abnormal growth problem

Method used

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  • Diffusion welding method of copper target material and back plate
  • Diffusion welding method of copper target material and back plate
  • Diffusion welding method of copper target material and back plate

Examples

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Embodiment 1

[0101] This embodiment provides a diffusion welding method of a copper target and a back plate, the diffusion welding method comprising the following steps:

[0102] (1) Prepare copper target material 20, C18000 back plate 10 and stainless steel pad 40 with grooves, wherein the area of ​​the copper target material 20 and stainless steel pad 40 is equal to the bottom area of ​​the back plate groove; The welding surface of the copper target is turned and smoothed with a diamond blade, and the welding surface of the back plate is turned and threaded. The protrusion of the thread is called a thread, and the distance between adjacent threads in the thread is 0.45mm , the height of the thread is 0.15mm;

[0103] (2) Clean and dry the copper target 20 obtained in step (1) and the C18000 back plate 10 with grooves, wherein the IPA cleaning solution is used for ultrasonic cleaning for 10 minutes, and then vacuumed at a vacuum degree of 0.005 Pa. Dry for 50 minutes, and then put the co...

Embodiment 2

[0111] This embodiment provides a method for diffusion welding of a copper target and a back plate, changing the thread size in step (1) to "wherein the distance between adjacent threads in the thread is 0.3mm, the height of the thread Be 0.05mm ", other conditions and embodiment 1 are exactly the same.

[0112] The copper target assembly obtained by the diffusion welding method of this embodiment has a high degree of bonding between the copper target and the back plate, and there is no abnormal grain growth. The enlarged view of the edge of the copper target is similar to that of Example 1; In addition, the obtained copper target assembly can ensure the uniformity of the coated film during the sputtering process.

Embodiment 3

[0114] This embodiment provides a method for diffusion welding of a copper target and a back plate, changing the thread size in step (1) to "wherein the distance between adjacent threads in the thread is 0.6mm, the height of the thread Be 0.25mm ", other conditions and embodiment 1 are identical.

[0115] The copper target assembly obtained by the diffusion welding method of this embodiment has a high degree of bonding between the copper target and the back plate, and there is no abnormal grain growth. The enlarged view of the edge of the copper target is similar to that of Example 1; In addition, the obtained copper target assembly can ensure the uniformity of the coated film during the sputtering process.

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Abstract

The invention relates to a diffusion welding method of a copper target material and a back plate. The diffusion welding method comprises the following steps that (1), the copper target material, the back plate and a cushion block, wherein the back plate is provided with a groove, and the areas of the copper target material and the cushion block are equal to the bottom area of the groove of the back plate; (2), the copper target material and the cushion block in the step (1) are sequentially put into the groove of the back plate to finish assembly treatment, and then a whole body is put into asheath; (3), the sheath obtained in the step (2) is sealed and then degassed; and (4), hot isostatic pressing welding is carried out on the sheath degassed in the step (3), and then the sheath and thecushion block are removed to finish diffusion welding of the copper target material and the back plate. According to the diffusion welding method, by improving an assembly structure of the copper target material and the back plate, the bonding degree of welding faces of the copper target material and the back plate is guaranteed, abnormal growth of crystal grains is effectively avoided, and particularly the phenomenon that the crystal grains are thick and large at the edge of the copper target material is avoided.

Description

technical field [0001] The invention relates to the technical field of semiconductors, and relates to a welding method of a target component, in particular to a diffusion welding method of a copper target and a back plate. Background technique [0002] Sputtering is one of the main technologies for preparing thin film materials. It uses ions generated by ion sources to accelerate and gather in a vacuum to form a high-speed energy ion beam, which bombards the solid surface, and the kinetic energy exchange occurs between the ions and the solid surface atoms. The atoms on the surface of the solid are separated from the solid and deposited on the surface of the substrate. The bombarded solid is the raw material for preparing the sputtering deposition film, which is generally called a sputtering target. [0003] Due to the different strengths of sputtering targets, in the actual application process, it is necessary to combine the sputtering targets that meet the performance requi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B23K28/02
CPCB23K28/02
Inventor 姚力军潘杰边逸军王学泽章丽娜罗明浩
Owner KONFOONG MATERIALS INTERNATIONAL CO LTD
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