Polishing method for gallium antimonide monocrystal wafer
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- WUHAN GAOXIN TECH
- Publication Date
- 2020-12-15
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Figure 1
Abstract
Description
technical field
[0001] The invention belongs to the technical field of surface processing of semiconductor materials, and in particular relates to a gallium antimonide single wafer polishing method. Background technique
[0002] In recent years, infrared detectors developed with epitaxial antimonide II superlattice materials on GaSb substrates have shown excellent detection performance in the long-wave and very long-wave infrared bands, and have good performance in the fields of gas monitoring, night vision, and infrared imaging. application prospects.
[0003] Epitaxial growth of high-quality antimonide II superlattice materials puts forward high quality requirements for GaSb substrate materials, requiring substrate materials with low defect density, high lattice integrity, and epitaxial buffer layers with atomic-level flatness , which puts high demands on the surface quality of GaSb substrates, and its application depends on the development of polishing technology. [00...