Preparation method of SiGe-GeSn-SiGe heterostructure high-injection-ratio PiN diode array and device of SiGe-GeSn-SiGe heterostructure high-injection-ratio PiN diode array
A diode array and heterostructure technology, which is applied in the manufacture of electric solid-state devices, semiconductor devices, semiconductor/solid-state devices, etc., can solve the problems of difficult to change design size and heavy weight, and achieve improved junction depth, suppressed leakage, and improved strike The effect of breakdown voltage
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Embodiment 1
[0077] See figure 1 , figure 1 It is a structural schematic diagram of a silicon-based reconfigurable symmetric dipole antenna according to an embodiment of the present invention. The silicon-based reconfigurable symmetrical dipole antenna includes: a semiconductor substrate 1, a first antenna arm 2, a second antenna arm 3, a third antenna arm 4, a fourth antenna arm 5, and a first DC bias line 6. The second DC bias line 7, the third DC bias line 8, the fourth DC bias line 9, the fifth DC bias line 10, the sixth DC bias line 11, the seventh DC bias line 12, An eighth DC bias line 13, a coaxial feeder line 14; the antenna arm is composed of a plurality of high injection ratio PiN diode array units with a SiGe-GeSn-SiGe heterostructure.
[0078] The silicon-based reconfigurable symmetric dipole antenna includes a first antenna arm, a second antenna arm, a third antenna arm and a fourth antenna arm, and the antenna arm includes a plurality of SiGe-GeSn-SiGe heterostructures Th...
Embodiment 2
[0121] See Figure 3a-Figure 3u , Figure 3a-Figure 3u It is a schematic diagram of a method for preparing a high injection ratio PiN diode array with a SiGe-GeSn-SiGe heterostructure according to an embodiment of the present invention. On the basis of the first embodiment above, the length of the intrinsic region is 120 microns (intrinsic A high injection ratio PiN diode array with a SiGe-GeSn-SiGe heterostructure with a region length between 50 microns and 150 microns) is described in detail as an example, and the specific steps are as follows:
[0122] S10, selecting a GeOI substrate.
[0123] See Figure 3a , the crystal orientation of the GeOI substrate 101 may be (100) or (110) or (111), without any limitation here. In addition, the doping type of the GeOI substrate 101 can be n-type or p-type, and the doping concentration is, for example, 0.5×10 14 ~0.5×10 15 cm -3 , the thickness of the top layer Ge is, for example, 30-120 μm.
[0124] S20, doping in the GeOI su...
Embodiment 3
[0167] Please refer to Figure 4 , Figure 4 It is a schematic diagram of a device structure of a SiGe-GeSn-SiGe heterostructure high injection ratio PiN diode according to an embodiment of the present invention. The high injection ratio heterogeneous PiN diode adopts the above as figure 2 The preparation method shown is made, specifically, the high injection ratio PiN diode with SiGe-GeSn-SiGe heterostructure is prepared and formed on the GeOI substrate 301, and the P region 303, N region 304 and the lateral direction of the diode are located on the The intrinsic region between the P region 303 and the N region 304 is located in the top GeSn layer 302 of the substrate. Wherein, the PiN diode adopts deep trench isolation technology, that is, a deep trench isolation region 307 is provided outside the P region 303 and the N region 304, and the depth of the isolation trench 307 is greater than or equal to the thickness of the top GeSn layer 302. In addition, the P region 303 ...
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