Preparation method of selective emitter of N-type battery

A selective, emitter technology, applied in the direction of circuits, electrical components, climate sustainability, etc., can solve the problems affecting the performance of silicon wafers, difficult doping, and damage to the suede, so as to facilitate mass production, deep junction Differentiation is controllable and the effect of reducing horizontal diffusion

Active Publication Date: 2021-09-07
CHANGZHOU SHICHUANG ENERGY CO LTD
View PDF8 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The secondary diffusion method needs to go through the steps of depositing mask layer-laser slotting (heavy doping area), first thermal diffusion (preparation of heavy doping area), cleaning mask layer, second thermal diffusion (preparation of light doping area) and other steps , needs to enter and exit the tube furnace twice, and needs to use laser equipment, which is easy to damage the suede structure, takes a long time, costs a lot, and the process is cumbersome
[0005] The masking method needs to go through the first thermal diffusion, mask patterning, BSG cleaning in the non-masked area, mask removal, second thermal diffusion and other steps. The whole process also needs to enter and exit the tube furnace twice, which takes a long time. cumbersome operation
[0006] The reverse etching method needs to go through steps such as thermal diffusion, mask patterning, acid etching (non-mask area), and mask layer removal. Although the process steps are simple, the process window is narrow, which is not conducive to process control, and damages the suede surface. Suitable for light-receiving surface structure preparation, and there is environmental protection pressure
[0007] The laser doping method is to perform patterned laser treatment on the surface of the BSG cell after thermal diffusion. There are two difficult

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0031] The specific implementation of the present invention will be further described below in conjunction with the examples. The following examples are only used to illustrate the technical solution of the present invention more clearly, but not to limit the protection scope of the present invention.

[0032] The technical scheme of concrete implementation of the present invention is:

[0033] A method for preparing the selective emitter of an N-type battery. The N-type single crystal silicon wafer is transported horizontally in a chain device, and the silicon wafer is sequentially subjected to the following processing steps during the transportation of the silicon wafer: texturing→primary oxidation→deposition Boron slurry→drying boron slurry→secondary oxidation→first high-temperature advancement→deposition of liquid boron source→second high-temperature advancement→third oxidation; Gas circulation between process steps; full chain:

[0034] 1) Texturing: performing chain te...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a preparation method of a selective emitter of an N-type battery. The following steps are carried out in sequence on a silicon wafer in chain type equipment: depositing boron slurry and taking the boron slurry as a doping source of a heavily doped region; performing high-temperature propulsion for the first time to enable the doping source in the heavily doped region to be diffused into the silicon wafer; depositing a liquid boron source, and taking the liquid boron source as a doping source of a lightly doped region; and performing high-temperature propulsion for the second time to enable the doping source of the heavily doped region and the doping source of the lightly doped region to be diffused into the silicon wafer. The boron slurry is used as the doping source of the heavily doped region, the liquid boron source is used as the doping source of the lightly doped region, the preparation of the emitter of the heavily doped region and the lightly doped region is realized through the chain type equipment, the external expansion is controllable, the textured surface is not damaged, the steps are simple, the time is saved, the yield is high, and large-batch production is facilitated. The whole-course chain mode is adopted, the whole preparation process is implemented in the same chain type equipment, the silicon wafer does not need to be turned over among a plurality of pieces of equipment, and the cleanliness of battery pieces is greatly improved. The process window is wide, the junction depth difference is controllable, and the boron source expansion influence is avoided.

Description

technical field [0001] The invention relates to the field of photovoltaics, in particular to a method for preparing a selective emitter of an N-type battery. Background technique [0002] The PERC cell SE process is mature and mass-produced in battery factories, but N-type cells have not yet formed a mass-produced selective emitter process. The main reason is that the boron doping process is more difficult, and the doping The difficulty is mainly determined by the nature of the material itself. [0003] At present, the N-type battery selective emitter preparation process mainly includes: secondary diffusion method, mask method, reverse etching method, laser doping method and doping slurry thermal diffusion method, etc. [0004] The secondary diffusion method needs to go through the steps of depositing mask layer-laser slotting (heavy doping area), first thermal diffusion (preparation of heavy doping area), cleaning mask layer, second thermal diffusion (preparation of light ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): H01L31/18H01L31/0224
CPCH01L31/1876H01L31/022425Y02P70/50
Inventor 奚琦鹏潘琦史卓群杨立功
Owner CHANGZHOU SHICHUANG ENERGY CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products