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Device and method for testing chirp performance of laser

A test device and laser technology, applied in the field of optical communication, can solve the problems of complex test system, very high stability requirements of the system optical path, unsuitability, etc., and achieve the effect of simple test system, improved product yield, and fast screening

Active Publication Date: 2021-09-21
QXP TECH INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, these testing methods and testing systems are usually complicated and have very high requirements on the stability of the system optical path, so they are not suitable for chirp performance screening in mass production of CML devices.

Method used

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  • Device and method for testing chirp performance of laser
  • Device and method for testing chirp performance of laser
  • Device and method for testing chirp performance of laser

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0032] Such as figure 1 As shown, a laser chirp performance test device provided by an embodiment of the present invention includes: a bit error meter or a signal generator, a current source, a bias device, a probe, and a spectrometer;

[0033] The BER tester or signal generator outputs alternating current (AC) signals, the BER tester outputs a pseudo-random sequence pattern, and the output waveform of the signal generator can be a square wave, a sine wave or the like. The output of the BER tester or signal generator is connected to the alternating current (AC) input of the bias device;

[0034] The output end of the current source is directly connected to the direct current (DC) input end of the bias device, and is used for applying a direct current bias current to the DML;

[0035] The alternating current (AC) output end and direct current (DC) output end of the biaser are connected to the positive and negative poles of the DML through probes, and are used to apply bias cur...

Embodiment 2

[0040] The difference from Implementation 1 is that the DML in this embodiment is placed on a Thermo Electric Cooler (TEC for short) to control the test temperature of the DML.

[0041] Optionally, the resolution of the spectrometer must be less than 1 / 2 of the relative offset between the wavelength of the DML "1" signal and the wavelength of the "0" signal, so as to ensure the accuracy of the test.

[0042] Optionally, the output light of the DML is coupled into the spectrometer through a single-mode fiber or a multi-mode fiber.

[0043] Optionally, the DML may be a laser with a structure such as a Fabry-Perot (FP) laser, a distributed feedback (DFB) laser, a distributed Bragg reflector (DBR), or a vertical cavity surface emitting laser (VCSEL).

[0044] Optionally, the probe adopts a radio frequency probe with less high-frequency signal attenuation.

[0045] The embodiment of the present invention is described by taking the preparation process of a CML device as an example....

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Abstract

The invention relates to the technical field of optical communication, and discloses a device and a method for testing chirp performance of a laser. The device comprises a bit error tester or a signal generator; a current source, used for outputting direct-current bias current; a bias device, the direct current input end of the bias device being connected with the current source, the alternating current input end being connected with the bit error tester or the signal generator, and the output end being connected with the positive and negative electrodes of the to-be-tested directly modulated laser through probes; and a spectrograph, connected with the output end of the to-be-measured directly modulated laser through a single-mode optical fiber or a multimode optical fiber. The frequency chirp size of the directly modulated laser can be evaluated by testing the offset between the 1 signal wavelength and the 0 signal wavelength of the spectrum of the directly modulated laser. The test system is simple, convenient to operate and rapid in screening, realizes the performance test of the chip level of the direct modulation laser, not only improves the product yield, but also saves the cost of process preparation, material and the like, and is very suitable for being applied to the batch production of the direct modulation laser.

Description

technical field [0001] The invention relates to the technical field of optical communication, in particular to a laser chirp performance testing device and method. Background technique [0002] In March 2021, the Ministry of Industry and Information Technology proposed the "Double Gigabit" Network Coordinated Development Action Plan (2021-2023), which plans to build a "Dual Gigabit" network infrastructure that fully covers urban areas and towns with conditions to achieve fixed and mobile networks. It generally has the ability of "gigabit to the home". In order to increase the bandwidth of fiber-to-the-home (FTTH) to meet the growing demands of services such as high-definition video, 3D games, and virtual reality, the fiber access network has begun to develop to a higher rate. At present, commercial optical modules with a rate above 10Gbit / s used in the FTTH field use externally modulated laser solutions, mainly including electro-absorption modulators (EAM) and Mach-Zehnder ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02
CPCG01M11/02
Inventor 郭菲程东
Owner QXP TECH INC