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In-situ infrared ATR testing method of thermal color phase change thin film material

An in-situ infrared and testing method technology, applied in the investigation stage/state change, etc., can solve the problem of better real-time monitoring of the phase change process of samples without thermochromic thin films, and achieve the advantages of simple operation, integrity maintenance, and avoidance of impact Effect

Pending Publication Date: 2021-10-01
GUANGZHOU INST OF ENERGY CONVERSION - CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In the existing technology, there is no better solution for real-time monitoring of the phase transition process of thermochromic thin film samples

Method used

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  • In-situ infrared ATR testing method of thermal color phase change thin film material
  • In-situ infrared ATR testing method of thermal color phase change thin film material
  • In-situ infrared ATR testing method of thermal color phase change thin film material

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0042] like Figure 1-4As shown, the thermochromic phase-change thin film sample is placed in parallel in the sample groove 4 of the sample stage 2 for program temperature control, so that the objective crystal 10 of the infrared ATR objective lens 9 is in effective contact with the thin film sample, and it is tested under different temperature conditions. Attenuated total reflection infrared test.

[0043] A kind of in-situ infrared ATR testing method of thermochromic phase change film material, specifically comprises the following steps:

[0044] S1: the in-situ sample stage is installed on the loading platform 1, and the in-situ sample stage is locked through the rotation and positioning of the fastener 14;

[0045] S2: For the thin film sample, the base of the sample faces downward, and the side with the thin film faces upward and is placed in parallel in the sample groove 4;

[0046] S3: Lower the loading platform 1 to a proper position, insert the ATR objective lens 9 ...

experiment example 1

[0058] like Image 6 As shown, the in-situ infrared ATR testing method of the thermochromic phase-change film material of Example 1 is used to test the glass substrate alum oxide composite film, and the thickness of the alum oxide composite film is 80nm. Locking; put the sample with the side of the alum oxide composite film up into the sample slot of the in-situ sample stage; lower the object platform to a suitable position, insert the ATR objective lens into the wedge-shaped slot of the objective lens and push it to the test position; drop The ATR objective lens makes the objective lens crystal contact with the film effectively, and the induction pressure value is preferably 20; the heating rate of the rapid temperature change module is set to 5°C / S, and the spectrum test of the alum oxide composite film is carried out under the heating condition.

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Abstract

The invention discloses an in-situ infrared ATR test method of a thermal color phase change thin film material. An in-situ sample table comprises a base, a cooling box, a rapid temperature changing module, a sample table body and a heat preservation upper cover, the base is provided with a heat insulation concave part, the cooling box is arranged in the concave part, a cooling water pipe is arranged on one side of the cooling box, and the rapid temperature changing module is tightly arranged over the cooling box; and the sample table is arranged above the rapid temperature changing module in a manner of sealing the concave part, the sample table is provided with a sample groove for placing a sample, and a heat preservation upper cover is arranged at the top of the sample table. According to the testing method provided by the invention, a new function of in-situ infrared spectrum characterization of the whole phase change process of the thermal hue phase change thin film material under different temperature conditions is realized; and the method has the advantages of simple operation, no need of sample preparation and pretreatment, maintenance of the integrity of the sample morphology, avoidance of the influence of a film substrate, and good data reproducibility.

Description

Technical field: [0001] The invention relates to the technical field of an infrared test method for a phase change process of a thermochromic phase-change thin film material, in particular to an in-situ infrared ATR test method for a thermochromic phase-change thin film material. Background technique: [0002] Thermochromic phase-change materials refer to temperature-sensitive phase-change functional materials, which undergo color changes and structural phase changes under changes in the temperature environment. The principle of attenuated total reflection infrared test technology: the infrared light emitted from the light source passes through the crystal with large refraction, and then projects to the surface of the sample with a small refractive index. The light penetrates the sample to a certain depth and then returns. The region has selective absorption, and the reflected light is weakened, so as to obtain the structural information of the chemical composition of the sa...

Claims

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Application Information

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IPC IPC(8): G01N25/12
CPCG01N25/12
Inventor 陈晓丽王树加陈佩丽刘世君
Owner GUANGZHOU INST OF ENERGY CONVERSION - CHINESE ACAD OF SCI
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