Electronic probe analysis method for testing trace elements Na, K, P, S and Ni of lunar glass beads

A trace element and electron probe technology, applied in the field of lunar glass bead sample monitoring, can solve problems such as electron beam burns, damage, glass without crystal structure, etc., and achieve the effect of improving accuracy and precision

Active Publication Date: 2021-12-24
INST OF GEOLOGY & GEOPHYSICS CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Existing technology can use high beam current and long time conditions to obtain trace elements of some minerals (such as Ti and Al of quartz), but high beam current and long time analysis conditions are not suitable for glass, because glass has no fixed crystal structure, Unable to withstand the bombardment of electron beams under such conditions, it is easy to be burned by electron beams
Moreover, the current electronic probe technology still has the following problems for the analysis of trace elements: (1) when the element content is 100 ppm or below, the accuracy and precision of the test data need to be improved; (2) due to the lack of matching standard samples , the accuracy and precision of the test data cannot be eva

Method used

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  • Electronic probe analysis method for testing trace elements Na, K, P, S and Ni of lunar glass beads
  • Electronic probe analysis method for testing trace elements Na, K, P, S and Ni of lunar glass beads
  • Electronic probe analysis method for testing trace elements Na, K, P, S and Ni of lunar glass beads

Examples

Experimental program
Comparison scheme
Effect test

Example Embodiment

[0092] Example 1

[0093] (1) Sample preparation

[0094] The moon glass bead moon (NWA13426) is used to perform a backseam image under the scanning electron microscope to determine the area to be analyzed.

[0095] (2) Select the appropriate glass standard

[0096] The glass sample is a Koma propellant glass standard (MPI-Ding-GOR128) and a muanwu glass standard (Vg-2, NMNH 111240-52).

[0097] (3) Determine the characteristic X-ray of the test of Na, K, P, S and Ni elements in glass samples

[0098] According to the characteristic X-ray properties of each element, the highest strength, the peak ratio is the highest, and the peak ratio is the characteristic X-ray to be tested.

[0099] The characteristic X rays of the test of Na, K, P, S, and Ni in the glass sample GOR128 are each (kα) feature X-ray.

[0100] (4) Determine the test voltage

[0101] Choose a uniform glass sample GOR128 similar to the moon glass beads, using Monte Carlo software to simulate the movement trajectory ...

Example Embodiment

[0139] Example 2

[0140] In step (4), the test voltage is 15kV, and the other steps are the same as in Example 1.

Example Embodiment

[0141] Example 3

[0142] In step (4), the test voltage is 20 kV, and other steps are the same as in Example 1.

[0143] Effects of different test voltages for electronic movement trajectories in GOR128 glass samples Figure 5 (a), the φ (ρz) curve of NA in GOR128 glass and the φ (ρz) curve of Ni are respectively Figure 5 (b), (c) shown.

[0144] pass through Figure 5 It can be seen that when using a higher acceleration voltage, the size of the electronic interaction zone is increased. Glass density is 2.5g / cm 3 , Calculate 1 * 10 6 Electronic trajectory. 1 * 10 4 An electronic trajectory is used to display an image. When the voltage is 15, 20 and 25 kV, the depth of the interaction zone is ~ 2.4 μm, ~ 4 μm and ~ 6.4 μm, respectively ( Figure 5 a). Further, when using a higher acceleration voltage, the depth of X-rays increases. The X-ray of Na (Kα) was produced from a sample depth of 1.8 μm from the sample depth of 2 μM using a 15 kV acceleration voltage. When a 20 kV accelerati...

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Abstract

The invention relates to an electronic probe analysis method for testing trace elements Na, K, P, S and Ni of lunar glass beads. The method comprises the following steps of: preparing a sample; selecting a proper glass standard sample; determining characteristic X-rays for testing Na, K, P, S and Ni elements; determining test voltage; determining current and beam spot conditions; determining an analysis spectrometer and a crystal; determining peak position test time of each element; determining characteristic X-ray peak positions and backgrounds of the Na, K, P and Ni elements in the glass standard sample; determining the peak position and background of the S element in the glass standard sample; correcting an overlapping peak; testing the components of the glass standard sample; and testing the components of a moon glass bead to be tested. The trace elements in the lunar glass are analyzed by optimizing the electronic probe analysis method, the accuracy (reproducibility) is high, the content change of the trace elements is within +/-10%, and the damage to the lunar glass beads caused by an electronic probe is effectively reduced.

Description

technical field [0001] The invention relates to the field of lunar glass bead sample monitoring, in particular to an electronic probe analysis method for testing lunar glass bead trace elements Na, K, P, S and Ni. Background technique [0002] Lunar glass beads are an important part of lunar soil and rocks, and their trace elements Na, K, P, S, and Ni (less than 100ppm) are important for distinguishing the types of lunar glass beads, revealing the evolution history of the mantle and crust, and reflecting It is of great significance to interpret the origin of moon rocks. Accurate determination of the content of these elements is the key to studying scientific issues such as the evolution of the moon. [0003] Currently, minerals / glasses can be tested for trace elements using secondary ion mass spectrometry (SIMS), laser ablation plasma mass spectrometry (LA-ICP-MS) and electron probe (EPMA). Although SIMS and LA-ICP-MS can provide lower element detection limits, both SIMS a...

Claims

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Application Information

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IPC IPC(8): G01N23/2202G01N23/2251G01N23/203G01N23/20008
CPCG01N23/2202G01N23/2251G01N23/203G01N23/20008
Inventor 张迪陈意毛骞贾丽辉
Owner INST OF GEOLOGY & GEOPHYSICS CHINESE ACAD OF SCI
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