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Submicron single-photon-magnitude tiny light spot measurement method based on silicon photomultiplier tube

A technology of silicon photomultiplier tube and measurement method, which is applied in the field of optical measurement and semiconductor optoelectronics, can solve the problems that pulse spot measurement cannot be realized, and achieve the effect of easy alignment

Active Publication Date: 2022-02-15
XI'AN POLYTECHNIC UNIVERSITY
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  • Description
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  • Application Information

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Problems solved by technology

[0003] The object of the present invention is to provide a method for measuring sub-micron single-photon-level tiny spots based on silicon photomultiplier tubes, which solves the problem of single-photon-level measurement in the prior art. The problem that the pulsed spot measurement cannot be realized

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  • Submicron single-photon-magnitude tiny light spot measurement method based on silicon photomultiplier tube
  • Submicron single-photon-magnitude tiny light spot measurement method based on silicon photomultiplier tube
  • Submicron single-photon-magnitude tiny light spot measurement method based on silicon photomultiplier tube

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Embodiment

[0065] As shown in Figure 1, the silicon photomultiplier tube 11 models adopted in the present embodiment are respectively selected from FBK (LF-HD, produced in Italy), NDL (EQR1011-1010C-T, produced in China) Hamamatsu S12571-010C (produced in Japan); The nano-shift stage 5 is nanoXYZ (no-load resolution 2nm; displacement range, 200 microns, made in Germany); microscope (including microscope objective lens 10 (model HAS-Y-2-40, bandwidth 10kHz-1.9GHz, noise factor 4.9dB , voltage gain 40dB (100×), made in Germany), pinhole light-transmitting sheet 9, laser beam splitter 8) is X-73, Olympus Corp., (produced by Olympus Corporation in Japan); the picosecond pulse laser is PDL-800D375 (center wavelength, 375nm; full width at half maximum, 44ps; repetition rate, 31.125kHz–80MHz; maximum average light energy, 0.7mW; made in Germany); digital oscilloscope 4 is DPO4102B-L for digital phosphor oscilloscope (sampling rate 5GSa / s, 1GHz bandwidth, produced by Tektronix in the United Sta...

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Abstract

The invention provides a submicron single-photon-magnitude tiny light spot measurement method based on a silicon photomultiplier tube, the silicon photomultiplier tube is used as a single-photon response detector, a precise displacement table is combined, and through two-dimensional or one-dimensional space scanning and deconvolution operation, the spatial distribution of the size and the light intensity of the single-photon-magnitude pulse laser spot focused by the microscope objective lens is obtained.

Description

technical field [0001] The invention belongs to the technical fields of optical measurement and semiconductor optoelectronics, and in particular relates to a method for measuring a submicron single-photon level tiny light spot based on a silicon photomultiplier tube. Background technique [0002] Micro-spot focusing technology has important applications in many fields. For example, laser self-collimation and measurement, optical information storage and transmission, and biological microfluidic tube preparation all need to focus the spot to a small size. Among them, the tiny spot of single-photon level has important applications in the fields of single-photon imaging, time-correlated fluorescence lifetime spectroscopy, and optical quantum information processing. At present, the commonly used measurement methods for tiny light spots include: flat panel / plane detector measurement method, (slit, knife edge, pinhole) scanning method, CCD (charge coupled device) method, etc. Jai...

Claims

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Application Information

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IPC IPC(8): G01B11/00G01J1/44
CPCG01B11/00G01J1/44G01J2001/4453
Inventor 张国青杨亚贤曹馨悦张晨刘丽娜
Owner XI'AN POLYTECHNIC UNIVERSITY
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