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Array scanning super-resolution microscopic imaging device, method and equipment based on multiple signal classification algorithm and storage medium

A multi-signal classification and microscopic imaging technology, applied in the field of laser scanning microscopic imaging, can solve the problems of difficulty in improving lateral resolution and low image acquisition rate, and achieve the effect of improving lateral imaging resolution and imaging speed.

Active Publication Date: 2022-03-01
HARBIN INST OF TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In order to overcome the above-mentioned defects in the prior art, the present invention provides an array scanning super-resolution microscopic imaging device, method, equipment and storage medium based on a multiple signal classification algorithm, which can solve the problem of horizontal resolution of the existing laser scanning microscopic imaging technology. It is difficult to improve the force and the problem of low image acquisition rate

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  • Array scanning super-resolution microscopic imaging device, method and equipment based on multiple signal classification algorithm and storage medium
  • Array scanning super-resolution microscopic imaging device, method and equipment based on multiple signal classification algorithm and storage medium
  • Array scanning super-resolution microscopic imaging device, method and equipment based on multiple signal classification algorithm and storage medium

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Embodiment approach 1

[0037] Such as figure 1 As shown, an array scanning super-resolution microscopic imaging device based on a multiple signal classification algorithm includes a laser light source 1, and a beam expander system 2, a microlens array 3, a collimator lens 4, and Scanning galvanometer 5 , scanning lens 6 , tube mirror 7 , dichroic mirror 8 , objective lens 9 , fluorescent sample 10 , stage 11 , collecting lens 12 and CCD camera 13 .

[0038] The microlens array 3 and the scanning galvanometer 5 constitute a scanning system. The focused spot array generated by the microlens array 3 is used as a point light source array, and the scanning galvanometer 5 changes the beam deflection angle so that the focused spot array scans the fluorescent sample 10 .

Embodiment approach 2

[0040] An array scanning super-resolution microscopic imaging method based on a multiple signal classification algorithm, comprising the following steps:

[0041] Step 1. Obtain a low-resolution image sequence of the fluorescent sample 10 by using an array scanning super-resolution microscopic imaging device.

[0042]The light beam emitted by the laser light source 1 passes through the beam expander system 2 to form parallel light incident on the microlens array 3, forms a point light source array on the focal plane of the collimator lens 4, and passes through the scanning galvanometer 5, scanning lens 6, tube mirror 7, The dichroic mirror 8 and the objective lens 9 focus on the surface of the fluorescent sample 10 to be measured, and the scanning galvanometer 5 changes the beam deflection angle to realize the two-dimensional array scanning of the fluorescent sample 10, and the fluorescence emitted by the fluorescent sample 10 passes through the objective lens 9, the dichroic ...

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Abstract

The invention discloses an array scanning super-resolution microscopic imaging device, method and equipment based on a multiple signal classification algorithm and a storage medium, belongs to the field of laser scanning microscopic imaging, and aims to solve the problems that the transverse resolution of the laser scanning microscopic imaging technology is difficult to improve and the image acquisition rate is low. The system comprises a beam expanding system, a micro lens array, a collimating lens, a scanning galvanometer, a scanning lens, a tube lens, a dichroscope, an objective lens, a sample, an objective table, a collecting lens and a CCD camera. The array scanning super-resolution microscopic imaging device is used for obtaining a low-resolution image sequence of a fluorescent sample, and the low-resolution image sequence is reconstructed based on a multiple signal classification algorithm to obtain a super-resolution image. An array point illumination mode and a multiple signal classification algorithm are combined, the axial chromatography capacity is achieved while the transverse imaging resolution is improved, the imaging rate is improved through an array scanning method, and biological fluorescence samples can be imaged in a random flickering mode.

Description

technical field [0001] The invention relates to the field of laser scanning microscopic imaging, in particular to an array scanning super-resolution microscopic imaging device, method, equipment and storage medium based on a multiple signal classification algorithm. Background technique [0002] In the mid-to-late 1950s, the confocal microscope was invented by Minsky. In 1977, C.J.R.Sheppard and A.Choudhury first clarified that the confocal microscope system under the action of a point pinhole mask sacrificed the field of view to increase the lateral resolution to the same aperture 1.4 times that of ordinary microscopes. Since then, confocal microscopic measurement technology has received widespread attention and has become an important branch of the field of microscopic science. [0003] Optical microscopy is widely used in fields such as biology and material science due to its non-destructive and non-contact imaging properties. Among them, the confocal microscopy imaging...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/64
CPCG01N21/6486
Inventor 邹丽敏陈佳张甦丁雪梅
Owner HARBIN INST OF TECH
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