Unlock instant, AI-driven research and patent intelligence for your innovation.

Same-layer gate-all-around nanowire/sheet CMOS (Complementary Metal Oxide Semiconductor) structure

A nanowire, gate-all-around technology, applied in nanotechnology, nanotechnology, nanotechnology for information processing, etc., can solve the problems of high cost, complex technology, and many manufacturing process steps of gate-all-around nanowires/chip field effect transistors. , to achieve the effect of enhancing performance and reliability, reducing process process, reducing preparation cost and process difficulty

Inactive Publication Date: 2022-04-12
张鹤鸣
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] However, the gate-all-around nanowire / sheet field effect transistor still has problems such as many manufacturing process steps, complicated technology, and higher cost than conventional CMOS.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Same-layer gate-all-around nanowire/sheet CMOS (Complementary Metal Oxide Semiconductor) structure
  • Same-layer gate-all-around nanowire/sheet CMOS (Complementary Metal Oxide Semiconductor) structure
  • Same-layer gate-all-around nanowire/sheet CMOS (Complementary Metal Oxide Semiconductor) structure

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0030] The present invention will be further described in connection with the specific embodiments, but the embodiments of the present invention are not limited thereto.

[0031] In order to better understand the present plan, the existing stacked ring grating nanowire / sheet CMOS structure will be described before introducing the same ring gate nanowire / sheet CMOS structure provided by the present invention.

[0032] Grid, also known as GAA, the gate metal surrounds the channel region of the MOSFET, and the difference between the ring gates and the ring gates are only the linear semiconductor. The latter-gate-gate is a sheet-like semiconductor, and the nanowire is a nano-rated semiconductor material, and the nano sheet is a sheet-type semiconductor material of the nanoscale thickness.

[0033] The ring nanowire / piece CMO is composed of a ring nani / sheet NMOS and a ring gate noodle / sheet PMOS, and the nanowire / sheet of the ring gate NMOS is a p-type semiconductor, the n...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a same-layer ring gate nanowire / sheet CMOS (Complementary Metal-Oxide-Semiconductor Transistor) structure, which comprises a substrate; an nMOS and a pMOS which are connected in series are arranged on the substrate; the nMOS comprises a first nano-body structure and a first gate electrode surrounding the first nano-body structure, and the pMOS comprises a second nano-body structure and a second gate electrode surrounding the second nano-body structure; the first nano-body structure and the second nano-body structure are arranged on the same layer; the conductive layers are made of semiconductor materials of the same conductive type; the first gate electrode and the second gate electrode are made of conductive materials with the same work function; the substrate material is bulk Si or SOI; the first nanometer body structure and the second nanometer body structure are both made of Si. The nanobodies of the nMOS and the pMOS are made of semiconductor materials of the same conductive type, and the gate electrodes are made of conductive materials of the same work function, so that the nanobodies can be prepared at the same time, and the performance and reliability of the CMOS structure and the integrated circuit thereof can be improved.

Description

Technical field [0001] The present invention belongs to the semiconductor technology, and more particularly to a co-layer grating nanowire / sheet CMOS structure. Background technique [0002] As the integrated circuit feature size breaks through 10 nm, short channel effects and leak barrier reduction effects make transistor properties unstable. At the same time, the leakage current is significantly increased due to quantum tunneling effect, so that the performance of the entire device is further deteriorated. Moreover, the process is more complicated during the preparation of the transistor under this size, which makes the development of Moore's laws and strokes. [0003] In order to suppress short channel effects, researchers have proposed a variety of nano-devices structures, including double gates, three gates, π-grids, S-ranging grids, Ω rigages, and gratings, which are MOSFETs (METAL-OXIDE) -Semiconductor Field-Effect Transistor, Metal-Oxide Semiconductor Field Effect Trans...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01L27/092H01L21/8238B82Y10/00
CPCH01L27/0924H01L21/823821H01L21/823828B82Y10/00
Inventor 陈超
Owner 张鹤鸣