Fully optical fiber probe scan type near-field optical microscope

Abstract

A complete optical probe scanning near field optical microscope is disclosed, comprising laser lighting system, monitoring system, sample support, light fiber probe scanning mechanism, three-dimensional rack and pinion adjustment, feedback control and data collecting system. Its basic idea that light fiber probe is fixed on tuning fork, through three -dimensional scanner, light fiber probe is made to scan on the surface of sample nearby, when light fiber probe is approaching the surface of sample, it will be influenced by effect of atom shearing force which will change concussion of tuning fork so that the information of distance between light fiber probe and sample can be obtained. The information is feedback to Z direction control system to make light fiber probe keep a distance to a constant value with surface of sample, whose appearance will be reflected by the information feedback, and light intensity collected by light fiber probe provides permeability of sample. The invention has the advantages of large scanning range, no limitation of sample, high modularization, convenient combination and change.

Description

technical field [0001] The invention relates to a near-field optical scanning microscope, in particular to a complete optical fiber probe scanning near-field optical microscope for scanning by moving an optical fiber probe. It is suitable for molecular biology (natural nanostructures), nanomaterials and nanodevices (artificial nanostructures), and high-density information optical storage, etc. technical background [0002] As early as 1928, Synge predicted that if a point source smaller than the wavelength illuminates an object at a close enough distance or a point detector smaller than the wavelength detects the scattered wave of an object at a close enough distance, the resolution can break through diffraction limit. After entering the 1980s, modern microscopy represented by near-field scanning optical microscopy has become a reality, not only breaking through the diffraction limit, but also opening up a series of new researches such as nano-optics and ultra-high-density ...

AI Technical Summary

Problems solved by technology

However, in the case of relatively large samples, it is difficult to scan by moving the sample, and this structure is no longer applicable

Especially for the recording device and recording medium in near-field optical storage, the recording device and the testing device are respectively located on both sides of the recording medium. Since the recording medium (usually an optical disc) is very large, and the recording process requires the focus of the illumination objective lens to be at The surface of the recording medium, it is unrealistic to scan by moving the recording medium

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