Method and apparatus for measuring chromium by chemical vapor generation-atomic fluorescence spectrometry

Abstract

The invention relates to a method for measuring chemical gas phase genesis atomic fluorescence spectrum of chromic and corresponding apparatus. The method comprises chemical gas phase genesis process of chromic; atomize process of genesis gas phase object and fluorescence detecting process of chromic molecule. The apparatus comprises a gas-liquid separating device having a color scatter atom fluorescence spectrometer, wherein the gas-liquid separating device comprising a gas-liquid separating device and a reactor which one end being connected with reducer and current-carrying / sample pipe, the other end being connected with the gas-liquid separating device which having its one end connected with a atomize device that connected with gas mixer, and have the other end connected with exhaust pipe. The invention has the advantages of being stable and reliable.

Description

technical field [0001] The utility model relates to a chemical gas phase generation (CVG) method, in particular to a chemical gas phase generation atomic fluorescence spectrum measurement method for chromium. Background technique [0002] The chemical vapor generation (CVG) method is a high-efficiency sampling technology widely used in atomic spectrometry. The general method is: mix the solution containing the element to be measured with the reducing agent solution at an appropriate acidity, and the mixed liquid is in the Fully react in a pipe of a certain size, the gas-liquid mixture formed by the reaction is divided into two phases in the separator, the liquid phase flows out through the waste pipe, and the gas phase containing the element to be measured is carried by the carrier gas into the atomizer for detection . The characteristic of chemical vapor phase generation sampling technology is that it can separate the element to be measured from the liquid phase, greatly e...

AI Technical Summary

Problems solved by technology

In the existing measurement techniques, except for the expensive inductively coupled plasma-atomic emission (ICP-AES) and inductively coupled plasma-mass spectrometry (ICP-MS), there is no cheap instrument that can simultaneously detect the above four elements. This is undoubtedly a new technical barrier for my country's electronics manufacturers

However, the chemical vapor generation-atomic fluorescence spectroscopy (CVG-AFS) technology that has been booming in my country in the past two decades can currently measure three elements: mercury (Hg), cadmium (Cd), and lead (Pb), but cannot detect chromium (Cr).

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