Dimesize dynamic piezoresistance, pressure sensor, and manufacturing method
A pressure sensor, dynamic piezoresistive technology, applied in chemical instruments and methods, fluid pressure measurement by changing ohmic resistance, measurement of fluid pressure, etc., to achieve excellent anti-light interference, protection against destructive impact, and improved performance.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Publication Date
- 2006-07-05
- Estimated Expiration
- Not applicable · inactive patent
Smart Images
Figure 1 Figure 2 Figure 3
Abstract
Description
technical field
[0001] The invention relates to a miniature dynamic piezoresistive pressure sensor and a manufacturing method thereof, in particular to a microdynamic piezoresistive pressure sensor based on MEMS (Micro Electro Mechanical System) silicon micromachining technology and a manufacturing method thereof, especially suitable for air Dynamic pressure measurement in dynamic tests (commonly known as wind tunnel tests). Background technique
[0002] The silicon micromachining technology of MEMS (Micro Electro Mechanical System) technology was used in the manufacture of piezoresistive pressure sensors in the late 1970s. Using the piezoresistive effect of silicon, a certain crystal orientation on the silicon wafer was used by the planar integrated circuit process. , the strain detection piezoresistors made by oxidation diffusion or ion implantation doping, photolithography and other methods at a certain position, and interconnected to form a test Wheatstone strain bridge....
Examples
Embodiment Construction
[0054] Using MEMS silicon micromachining technology to manufacture miniature pressure sensitive chips, the unit size of the chip is 1.5×1.5, the size of the sensitive diaphragm is 1.0×1.0, and an island-shaped hard core is left in the center of the diaphragm, and the size of the hard core is 0.7 ×0.7, the force-sensitive detection resistor is distributed on the film between the hard core and the boundary hard frame, and the position is determined according to the design method of the E-type sensitive chip. The implementation steps are as follows Figure 1 to Figure 5 The implementation shown:
[0055] figure 1 The double-sided polished silicon wafer used as an elastic element is covered with 1 μm thick SiO on both sides by traditional thermal oxidation technology in MEMS technology processing. 2 Layer 2, and then use standard LPCVD method to cover 3000A thick Si on both sides 3 N 4 Layer 1, use two photolithography techniques to etch away the Si on the back of the silicon ...