Patents
Literature
Hiro is an intelligent assistant for R&D personnel, combined with Patent DNA, to facilitate innovative research.
Hiro

72 results about "Silicon micromachining" patented technology

Metal-silicon compound cantilever beam type microelectronic mechanical system probe card and manufacture method thereof

The invention relates to a metal-silicon composite cantilever beam typed micron-electronic mechanical system probing card and a preparation method thereof; an ultraviolet thick film photolithography and bulk silicon micro-processing composite process is adopted to prepare a metal-silicon composite cantilever beam probing card structure, thus replacing an existing probing card structure consisting of single silicon or metal. The ultraviolet thick film photolithography process is used for preparing the metal probe with high depth / width ratio and metal circuit transmission wires below the probes, and the bulk silicon micro-processing composite process is used to prepare the silicon cantilever beam structure. The force during the testing process is commonly borne by the silicon cantilever beam and the metal circuit above the silicon cantilever beam; the electric and mechanical property of the probing card structure is controlled by adjusting the geometrical parameters of the metal circuit leads and the silicon cantilever beam; the probes above the probing card can be arranged by the positions of the pins of the chip to be tested; the probe tips are corresponding to the position of the pins of the chip one by one. The end of the metal circuit transmission wire leads the circuit to be connected on the back surface by a through hole electro-plating or wire punching type on a silicon substrate and leads the circuits to be connected onto printing circuit boards and test machine platforms further.
Owner:SHANGHAI JIAO TONG UNIV

Silicon-based fan-out package of integrated heat-dissipation structure and wafer-level packaging method

The invention discloses a silicon-based fan-out package of an integrated heat-dissipation structure and a wafer-level packaging method. Based on a silicon-based fan-out package technology, a heat-dissipation structure is directly formed on a second surface of a silicon substrate after a chip is embedded. A wafer-level process is used for manufacturing, the machining is high-precision, the processis simple, and the price is low. Compared with conventional mechanically processed heat sinks, the silicon-based fan-out package can use a silicon micromachining process directly on a silicon substrate to produce a finer heat dissipation structure, create a larger heat dissipation area within the same unit volume, and achieve better heat radiation. This heat dissipation structure is directly integrated on the backside of a chip embedded in a silicon substrate, and has a high integration density, a small size, and a light weight. In addition, the interface between the external environment and the chip is reduced, and the heat dissipation effect is further improved. Preferably, a heat-dissipating cover plate with forced water cooling can be integrated on the heat dissipation structure of thesecond surface of the silicon substrate to obtain better heat dissipation efficiency.
Owner:HUATIAN TECH KUNSHAN ELECTRONICS

Dimesize dynamic piezoresistance, pressure sensor, and manufacturing method

InactiveCN1796956AGuaranteed dynamic frequency response characteristicsMeet the response frequencySemi-permeable membranesFluid pressure measurement using ohmic-resistance variationCooking & bakingEngineering
The invention is a method for manufacturing a micro dynamic pressure resistance pressure sensor, using MEMS silicon micromachining method to manufacture a micro pressure sensitive chip of an E-type silicon cup force sensitive structure; the back of the chip is welded with Pyrex or GG-17 glass ring plate to form a pressure sensitive component; the naked surface of the glass ring is pasted at the upper end of the a ceramic pipe provided with spline groove on the circumferential surface, which are provided with silver baking electrode; the lead of the pressure sensitive component is an inner lead welded on an inner pressure soldered dot on the right side of the chip, and the other end of the inner lead is welded to the upper end of the silver baking electrode, the outer lead is welded to the lower end of the silver baking electrode; the pressure sensitive component is put in the outer pipe of the sensor and seal-boned with the outer pipe; the top of the sensor is welded with a top cover, and a small hole is made in the center of the top cover corresponding the chip; a micro cable drawing out the outer lead is fixed by injection component with a micro air pipe connected with back pressure cavity of the chip and then they are bonded to the bottom end of the outer pipe of the sensor; and the manufactured sensor has very strong light resistance and electromagnetic interference resistance and prevents destructive impacts.
Owner:KUNSHAN SHUANGQIAO SENSOR MEASUREMENT CONTROLLING

Micro machining method for bulk silicon for forming cavity structure of MEMS (micro-electromechanical systems) thermopile detector

The invention provides a micro machining method for bulk silicon for forming a cavity structure of an MEMS (micro-electromechanical systems) thermopile detector. The method comprises the following steps of: providing a silicon substrate, growing a silica membrane on the silicon substrate in a thermal oxidation manner, and forming a thermopile area and an infrared absorption area on the silica membrane. A thermal nodal area is arranged at one end of the thermopile area, close to the infrared absorption area, and a cold nodal area is arranged at the other end of the thermopile area, far away from the infrared absorption area. A silicon nitride and silica compound membrane structure is deposited on a thermopile structure layer, and a corrosion opening is formed in a compound membrane through photoetching. A release channel of the thermopile structure is formed by the corrosion opening. Through the release channel, a superficial layer on the surface of the bulk silicon is corroded by using an isotropy corrosion method so as to form a thin cavity of the superficial layer of the bulk silicon, and a bulk silicon deep layer below the thin cavity is corroded by using an anisotropy corrosion method so as to form a regular smooth ladder-shaped cavity structure, and therefore, the cavity structure in the bulk silicon is finally formed. The cavity structure formed by using the method has a regular and smooth inner surface and is good in structure symmetry.
Owner:中科芯未来微电子科技成都有限公司

Process for manufacturing three-layer continuous surface type MEMS deformable mirror based on bonding process

InactiveCN101604069ASolve the disadvantages of difficult processingEliminates the effects of static pull-inOptical elementsBonding processOut of plane displacement
The invention discloses a process for manufacturing a three-layer continuous surface type MEMS deformable mirror based on a bonding process, which mainly comprises the following steps: performing dry-etching of a releasing hole on the upper surface of an SOI wafer, partially releasing a middle oxidation layer of the SOI wafer, performing wet-etching on the lower surface of the SOI wafer, depositing a metal on another substrate (silicon wafer or glass) as an electrode structure, and finally bonding the substrate and the SOI wafer. The process is characterized in that a bulk silicon micromachining process and a surface micromachining process are combined, and an upper two-layer structure obtained by adopting the bulk silicon process and a lower electrode structural layer obtained by adopting surface micromachining are bonded to form a three-layer micromechanical structure. The process for manufacturing the three-layer continuous surface type MEMS deformable mirror based on the bonding process has a relatively easy manufacturing process, overcomes the defect that the prior continuous surface micromechanical deformable mirror is difficult to process through three-layer surface micromachining, can eliminate the defect of short circuit due to electrostatic draw-in by adding a silicon nitride insulating layer, and can be widely applicable in the fields of optical communication and adaptive optics; and the machined deformable mirror can obtain large out-of-plane displacement.
Owner:INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products